Spark-source mass spectrometric assessment of silicon concentrations in silicon-doped gallium arsenide single crystals.
The spark-source mass spectrometric assessment of silicon concentrations in silicon-doped vertical-gradient-freeze gallium arsenide is presented. The silicon concentrations determined are compared with the charge-carrier densities measured by means of the Hall effect with van der Pauw symmetry along the axis of a single crystal.
Wiedemann
B
B
Johann Wolfgang Goethe-Universität, Institut für Kernphysik, Frankfurt, Germany. wiedemann@ikf.uni-frankfurt.de
Meyer
J D
JD
Jockel
D
D
Freyhardt
H C
HC
Birkmann
B
B
Müller
G
G