title: Electron energy-loss near-edge structure -- a tool for the investigation of electronic structure on the nanometre scale.
abstract: Electron energy-loss near-edge structure (ELNES) is a technique that can be used to measure the electronic structure (i.e. bonding) in materials with subnanometre spatial resolution. This review covers the theoretical principles behind the technique, the experimental procedures necessary to acquire good ELNES spectra, including potential artefacts, and gives examples relevant to materials science.
authors.affiliation: Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge, CB2 3QZ, UK. vjk20@cam.ac.uk
authors.forename: V J
authors.initials: VJ
authors.lastname: Keast
authors.forename: A J
authors.initials: AJ
authors.lastname: Scott
authors.forename: R
authors.initials: R
authors.lastname: Brydson
authors.forename: D B
authors.initials: DB
authors.lastname: Williams
authors.forename: J
authors.initials: J
authors.lastname: Bruley