title: Selective-resputtering-induced perpendicular magnetic anisotropy in amorphous TbFe films.
abstract: Perpendicular magnetic anisotropy energy in rf magnetron sputtered amorphous TbFe films is measured to increase exponentially with pair-order anisotropy induced by the selective resputtering of surface adatoms during film growth.
authors.affiliation: Naval Research Laboratory, Washington, DC 20375-5000, USA.
authors.forename: V G
authors.initials: VG
authors.lastname: Harris
authors.forename: T
authors.initials: T
authors.lastname: Pokhil