title: Spark-source mass spectrometric assessment of silicon concentrations in silicon-doped gallium arsenide single crystals.
abstract: The spark-source mass spectrometric assessment of silicon concentrations in silicon-doped vertical-gradient-freeze gallium arsenide is presented. The silicon concentrations determined are compared with the charge-carrier densities measured by means of the Hall effect with van der Pauw symmetry along the axis of a single crystal.
authors.affiliation: Johann Wolfgang Goethe-Universität, Institut für Kernphysik, Frankfurt, Germany. wiedemann@ikf.uni-frankfurt.de
authors.forename: B
authors.initials: B
authors.lastname: Wiedemann
authors.forename: J D
authors.initials: JD
authors.lastname: Meyer
authors.forename: D
authors.initials: D
authors.lastname: Jockel
authors.forename: H C
authors.initials: HC
authors.lastname: Freyhardt
authors.forename: B
authors.initials: B
authors.lastname: Birkmann
authors.forename: G
authors.initials: G
authors.lastname: Müller