Development of a new in-laboratory XAFS apparatus based on new concept.
In a conventional in-laboratory XAFS apparatus using conventional X-ray source, sealed tube or rotating anode, has been used. In which the X-ray source is fixed and the sample is moved (translated and rotated). Hence it has been difficult or required a complex method in order to put a heavy element, such as a cryogenic cooler, high temperature furnace and an in-situ reacting cell, at a sample position. Nowadays, there is a strong demand for obtaining dynamic information of a sample and in-situ observation becomes almost unavoidable. We have developed a compact X-ray tube and a new goniometer on which X-ray source is moved and monochromatic X-ray comes out of goniometer is fixed. Therefore it becomes easier to put a various cell at a sample position.
Taguchi
T
T
X-ray Research Laboratory, Rigaku Corporation, Tokyo, Japan. takey@rigaku.co.jp
Harada
J
J
Kiku
A
A
Tohji
K
K
Shinoda
K
K