title: Synchronous scanning of undulator gap and monochromator for XAFS measurements in soft x-ray region.
abstract: Synchronous scanning of the undulator gap and a monochromator was done to obtain smooth profiles of incident x-rays that are suitable for XAFS measurements. By changing the gap from 150 mm(B=0.12 T) to 140 mm (B=0.15 T) with the use of the 3rd to 11th harmonic peaks, soft x-rays with energy from 200 eV to 1200 eV were obtained. The smooth profile of the incident x-rays provided high-quality measurement of XANES and EXAFS spectra in the soft x-ray region. Issues that would improve the synchronous scanning system are discussed.
authors.affiliation: National Institute of Material and Chemical Research, Tsukuba, Ibaraki, Japan. tanakat@nimc.go.jp
authors.forename: T
authors.initials: T
authors.lastname: Tanaka
authors.forename: N
authors.initials: N
authors.lastname: Matsubayashi
authors.forename: M
authors.initials: M
authors.lastname: Imamura
authors.forename: H
authors.initials: H
authors.lastname: Shimada