title: Applications of dynamical diffraction under locally plane wave conditions: defects in nearly perfect crystals and X-ray refractometry.
abstract: In a previous paper, the concept of a locally plane wave was explained theoretically. In such a configuration, the fringe pattern recorded on the film can be considered as a phase analyser. Here the experimental analysis is presented, showing examples of interesting applications to X-ray refractometry and to the visualization of the strain field around isolated defects.
authors.affiliation: User Program Division, Advanced Photon Source, Argonne National Laboratory, IL 60439, USA. mocella@esrf.fr
authors.forename: V
authors.initials: V
authors.lastname: Mocella
authors.forename: Y
authors.initials: Y
authors.lastname: Epelboin
authors.forename: J P
authors.initials: JP
authors.lastname: Guigay
authors.forename: J
authors.initials: J
authors.lastname: Härtwig