Quantitative analysis of L-edge white line intensities: the influence of saturation and transverse coherence.
We have performed x-ray absorption spectroscopy at the Fe, Ni, and Co L2,3 edges of in situ grown thin magnetic films. We compare electron yield measurements performed at SSRL and BESSY-I. Differences in the L2,3 white line intensities are found for all three elements, comparing data from the two facilities. We propose a correlation between spectral intensities and the degree of spatial coherence of the exciting radiation. The electron yield saturation effects are stronger for light with a higher degree of spatial coherence. Therefore the observed, coherence related, intensity variations are due to an increase in the absorption coefficient, and not to secondary channel related effects.
Hahlin
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Department of Physics, Uppsala University, Sweden. anders.hahlin@fysik.uu.se
Karis
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Dunn
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Arvantis
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