Applications of dynamical diffraction under locally plane wave conditions: defects in nearly perfect crystals and X-ray refractometry.
In a previous paper, the concept of a locally plane wave was explained theoretically. In such a configuration, the fringe pattern recorded on the film can be considered as a phase analyser. Here the experimental analysis is presented, showing examples of interesting applications to X-ray refractometry and to the visualization of the strain field around isolated defects.
Mocella
V
V
User Program Division, Advanced Photon Source, Argonne National Laboratory, IL 60439, USA. mocella@esrf.fr
Epelboin
Y
Y
Guigay
J P
JP
Härtwig
J
J