title: Quantitative analysis of L-edge white line intensities: the influence of saturation and transverse coherence.
abstract: We have performed x-ray absorption spectroscopy at the Fe, Ni, and Co L2,3 edges of in situ grown thin magnetic films. We compare electron yield measurements performed at SSRL and BESSY-I. Differences in the L2,3 white line intensities are found for all three elements, comparing data from the two facilities. We propose a correlation between spectral intensities and the degree of spatial coherence of the exciting radiation. The electron yield saturation effects are stronger for light with a higher degree of spatial coherence. Therefore the observed, coherence related, intensity variations are due to an increase in the absorption coefficient, and not to secondary channel related effects.
authors.affiliation: Department of Physics, Uppsala University, Sweden. anders.hahlin@fysik.uu.se
authors.forename: A
authors.initials: A
authors.lastname: Hahlin
authors.forename: O
authors.initials: O
authors.lastname: Karis
authors.forename: B
authors.initials: B
authors.lastname: Brena
authors.forename: J H
authors.initials: JH
authors.lastname: Dunn
authors.forename: D
authors.initials: D
authors.lastname: Arvantis