title: Risk assessment for heavy ions of parts tested with protons.
abstract: An internuclear cascade-evaporation code is used to model energy deposition in thin slabs of silicon. This model shows that protons produce a significant number of events with effective Linear Energy Transfer (LET) greater than 8 MeV cm2/mg and demonstrates that proton testing of microelectronic components can be an effective way to screen devices for low earth orbit susceptibility to heavy ions.
authors.affiliation: NASA Johnson Space Center, Houston, Texas 77058-3696, USA.
authors.forename: P M
authors.initials: PM
authors.lastname: O'Neill
authors.forename: G D
authors.initials: GD
authors.lastname: Badhwar
authors.forename: W X
authors.initials: WX
authors.lastname: Culpepper
mesh_terms: D003198:Computer Simulation; D004581:Electronics; D019471:Elementary Particle Interactions; D004868:Equipment Failure; D020450:Heavy Ions; D018499:Linear Energy Transfer; D008962:Models, Theoretical; D009010:Monte Carlo Method; D009686:Nuclear Physics; D011522:Protons; D018570:Risk Assessment; D012825:Silicon; D013026:Space Flight
chemical_list: D011522:Protons; D012825:Silicon