title: Charge collection and radiation hardness of a SOI microdosimeter for medical and space applications.
abstract: The first results obtained using a SOI device for microdosimetry applications are presented. Microbeam and broadbeam spectroscopy methods are used for determining minority carrier lifetime and radiation damage constants. A spectroscopy model is presented which includes the majority of effects that impact spectral resolution. Charge collection statistics were found to substantially affect spectral resolution. Lateral diffusion effects significantly complicate charge collection.
authors.affiliation: Department of Engineering Physics, University of Wollongong, Australia.
authors.forename: P D
authors.initials: PD
authors.lastname: Bradley
authors.forename: A B
authors.initials: AB
authors.lastname: Rosenfeld
authors.forename: K K
authors.initials: KK
authors.lastname: Lee
authors.forename: D N
authors.initials: DN
authors.lastname: Jamieson
authors.forename: G
authors.initials: G
authors.lastname: Heiser
authors.forename: S
authors.initials: S
authors.lastname: Satoh
mesh_terms: D000512:Alpha Particles; D055592:Biophysical Phenomena; D001703:Biophysics; D016754:Boron Neutron Capture Therapy; D003198:Computer Simulation; D018499:Linear Energy Transfer; D008962:Models, Theoretical; D009502:Neutrons; D010315:Particle Accelerators; D019047:Phantoms, Imaging; D011522:Protons; D011874:Radiometry / Q000295:instrumentation*; D012825:Silicon; D013057:Spectrum Analysis; D013679:Technology, Radiologic
chemical_list: D011522:Protons; D012825:Silicon