title: Characterization of the transverse coherence of hard synchrotron radiation by intensity interferometry.
abstract: The transverse coherence of x rays was measured with an intensity interferometer using a 120-microeV-bandwidth monochromator operating at 14.41 keV. By analyzing the transverse coherence profiles, a vertical source profile of a 25-m long undulator of SPring-8, as well as the coherence degradation by a phase object in the beam path, were quantitatively characterized.
authors.affiliation: SPring-8/JASRI, Mikazuki, Hyogo 679-5198, Japan.
authors.forename: M
authors.initials: M
authors.lastname: Yabashi
authors.forename: K
authors.initials: K
authors.lastname: Tamasaku
authors.forename: T
authors.initials: T
authors.lastname: Ishikawa