title: Direct determination of silicon in powdered aluminium oxide by use of slurry sampling with in situ fusion graphite-furnace atomic-absorption spectrometry.
abstract: A direct method for determination of silicon in powdered high-purity aluminium oxide samples, by slurry sampling with in situ fusion graphite-furnace atomic-absorption spectrometry (GF-AAS), has been established. A slurry sample was prepared by 10-min ultrasonication of a powdered sample in an aqueous solution containing both sodium carbonate and boric acid as a mixed flux. An appropriate portion of the slurry was introduced into a pyrolytic graphite furnace equipped with a platform. Silicon compounds to be determined and aluminium oxide were fused by the in situ fusion process with the flux in the furnace under optimized heating conditions, and the silicon absorbance was then measured directly. The calibration curve was prepared by use of a silicon standard solution containing the same concentration of the flux as the slurry sample. The accuracy of the proposed method was confirmed by analysis of certified reference materials. The proposed method gave statistically accurate values at the 95% confidence level. The detection limit was 3.3 microg g(-1) in solid samples, when 300 mg/20 mL slurry was prepared and a 10 microL portion of the slurry was measured. The precision of the determination (RSD for more than four separate determinations) was 14% and 2%, respectively, for levels of 10 and 100 microg g(-1) silicon in aluminium oxide.
authors.affiliation: Instrumental Analysis Center, Kitami Institute of Technology, Japan. minami@crc.kitami-it.ac.jp
authors.forename: H
authors.initials: H
authors.lastname: Minami
authors.forename: T
authors.initials: T
authors.lastname: Yoshida
authors.forename: K
authors.initials: K
authors.lastname: Okutsu
authors.forename: Q
authors.initials: Q
authors.lastname: Zhang
authors.forename: S
authors.initials: S
authors.lastname: Inoue
authors.forename: I
authors.initials: I
authors.lastname: Atsuya
mesh_terms: D000537:Aluminum Oxide / Q000032:analysis*; D011208:Powders / Q000737:chemistry; D011786:Quality Control; D012825:Silicon / Q000032:analysis*; D013054:Spectrophotometry, Atomic / Q000379:methods*; D013696:Temperature
chemical_list: D011208:Powders; D000537:Aluminum Oxide; D012825:Silicon