Numerical modelling of mass resolution in a scanning atom probe.
We have recently suggested a novel method for improving mass resolution in the scanning atom probe (SAP), based on a post-deceleration scheme. A two-conductor counter electrode is used, and the high voltage pulse is applied to the front conductor, with the rear conductor being held at ground. For a separation between the two conductors of 100 microm or less, ions travel between the two while the pulse is essentially constant, so that the ion leaves the counter electrode with an energy equivalent to the applied d.c. potential. In this paper, we have used a numerical model for the electric fields in the SAP to verify the results of the simpler analytical approach used earlier. In particular, the ion acceleration in the vicinity of the tip, previously assumed to be instantaneous, was modelled using a hyperboloidal field approximation. The numerical model was used to calculate the flight time for ions having a range of masses and evaporating over a range of times at the peak of a high voltage pulse. Modelled mass resolutions, calculated in this way, were then compared with analytical expressions, and were found to agree very well. This shows that the earlier assumption of an instantaneous acceleration did not seriously affect the validity of the approach.
Cerezo
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Department of Materials, University of Oxford, UK. alfred.cerezo@materials.oxford.ac.uk
Vaumousse
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