Characterization of optical diffraction gratings by use of a neural method.
Optical scatterometry by use of a neural network is now recognized as an efficient method for retrieving dimensions of gratings in semiconductors or glasses. For an on-line control, a small number of measurements and a rapid data treatment are needed. We demonstrate that these requirements can be met by combining data preprocessing and a proper neural learning method. A good accuracy is attainable with the measurement of only a few orders, even in the presence of experimental errors, with a reduction in learning and computing time.
Robert
Stéphane
S
Laboratoire Traitement du Signal et Instrumentation, Unité Mixte de Recherche, Centre National de la Recherche Scientifique 5516, Saint-Etienne, France. stephane.robert@univ-st-etienne.fr
Mure-Ravaud
Alain
A
Lacour
Dominique
D