Off-diagonal Mueller matrix elements in backscattering from highly diffusive media.
Measurements of a reduced Mueller matrix in backscattering from highly diffusive, dielectric samples are reported as a function of the angle of incidence. It was found that the off-diagonal terms depend greatly on the angle of incidence, increasing to a maximum near grazing incidence. We show that, despite a significant scattering originating in the bulk of such diffusive media, the nontrivial behavior of the off-diagonal Muller matrix is primarily due to surface scattering phenomena. The experimental data can be simply explained by assuming a random orientation of small particles and considering only double scattering in the plane of the surface.
Ellis
Jeremy
J
The School of Optics/CREOL, University of Central Florida, Orlando 32816, USA.
Caillard
Paul
P
Dogariu
Aristide
A