title: Measurements of field enhancement introduced by a local electrode.
abstract: Direct measurements of field enhancement introduced by a local electrode have been carried out on a scanning atom probe (SAP). The results show that an enhancement factor of more than 2 can be obtained simply by reducing the specimen-to-electrode distance from 1.5 mm to 10 microm. Further enhancement can be achieved if the electrode has a smaller aperture. This suggests that a specimen with tip radius of approximately 200 nm, which usually is too blunt to be analysed in a standard atom probe, could now be analysed by SAP. The capability of analysing blunt tips will expand the applicability of SAP to a much broader range of materials.
authors.affiliation: Department of Materials, University of Oxford, UK. min.huang@materials.ox.ac.uk
authors.forename: M
authors.initials: M
authors.lastname: Huang
authors.forename: A
authors.initials: A
authors.lastname: Cerezo
authors.forename: P H
authors.initials: PH
authors.lastname: Clifton
authors.forename: G D
authors.initials: GD
authors.lastname: Smith