Analysis of fiber probes of scanning near-field optical microscope by field emission microscopy.
It is shown that field emission microscopy and related methods can be used to analyze the metal coated fiber tips, which nowadays are the most frequently used sensor for the scanning near-field optical microscopy (SNOM). Metal free and thus non field-emitting aperture for the light transmission on the tip apex can be directly seen and its parameters can be measured, which is very important for the interpretation of SNOM data.
Sekatskii
S K
SK
Institute of Spectroscopy Russian Academy of Sciences, Troitsk, Moscow region. sergey.sekatskii@ipmc.unil.ch
Mironov
B N
BN
Lapshin
D A
DA
Dietler
G
G
Letokhov
V S
VS