title: Fourier images feature of lattice fringes formed by low-loss electrons as observed using spatially-resolved EELS technique.
abstract: The lattice fringes of inelastically scattered electrons were investigated using spatially-resolved electron energy-loss spectroscopy (EELS) technique. The intensity profiles of lattice fringes formed by low-loss electrons were observed, and their position and contrast were elucidated with high spatial resolution. It was found that the conventional transmission electron microscope image includes low-loss images, which are the integrated image of through-focus images weighted by the intensity of the EEL spectrum. The modulation feature in the lattice fringes of inelastically scattered electrons is similar to the Fourier images. It means that the exit wave field of elastically scattered electrons is almost preserved in that of low-loss electrons.
authors.affiliation: Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba, Ibaraki, Japan. kimoto.koji@nims.go.jp
authors.forename: K
authors.initials: K
authors.lastname: Kimoto
authors.forename: Y
authors.initials: Y
authors.lastname: Matsui