title: Full frequency back-action spectrum of a single-electron transistor during qubit readout.
abstract: We calculate the spectral density of voltage fluctuations in a single-electron transistor (SET), biased to operate in a transport mode where tunneling events are correlated due to Coulomb interaction. The whole spectrum from low frequency shot noise to quantum noise at frequencies comparable to the SET charging energy (EC/h) is considered. We discuss the back-action during readout of a charge qubit and conclude that single-shot readout is possible using the radio-frequency SET.
authors.affiliation: Microtechnology Center at Chalmers MC2, Department of Microelectronics and Nanoscience, Chalmers University of Technology and Göteborg University, S-412 96, Göteborg, Sweden. tfygj@fy.calmers.se
authors.forename: Göran
authors.initials: G
authors.lastname: Johansson
authors.forename: Andreas
authors.initials: A
authors.lastname: Käck
authors.forename: Göran
authors.initials: G
authors.lastname: Wendin