Near-field intensity distribution of waves scattered from slightly rough surfaces.
The near fields of electromagnetic waves scattered from two-dimensional slightly rough surfaces are studied by using the stochastic functional approach. The correlation coefficient between the surface and the intensity of the scattered-wave field is investigated to estimate the fidelity of near-field intensity images. We show that the fidelity depends on both the polarization and the angle of incidence and that high fidelity can be obtained by a TM-polarized incident wave whose incident angle is not close to the critical angle of the total reflection.
Kawanishi
Tetsuya
T
Communications Research Laboratory, Ministry of Public Management, Home Affairs, Posts and Telecommunications, Koganei, Tokyo, Japan. kawanish@crl.go.jp