title: Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS.
abstract: Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of approximately 30 s per 0.3 mm(3) sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10(-4). This configuration is therefore highly efficient for fast strain mapping in thin components using a second-generation synchrotron source.
authors.affiliation: Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, UK. alexander.korsunsky@eng.ox.ac.uk
authors.forename: Alexander M
authors.initials: AM
authors.lastname: Korsunsky
authors.forename: Steve P
authors.initials: SP
authors.lastname: Collins
authors.forename: R Alexander
authors.initials: RA
authors.lastname: Owen
authors.forename: Mark R
authors.initials: MR
authors.lastname: Daymond
authors.forename: Saïda
authors.initials: S
authors.lastname: Achtioui
authors.forename: Karen E
authors.initials: KE
authors.lastname: James