title: Electron correlation effects in resonant inelastic X-ray scattering of NaV2O5.
abstract: Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in NaV2O5. In contrast to single photon techniques, RIXS at the vanadium L3 edge is able to probe d-d* transitions between V d-bands. A sharp energy loss feature is observed at -1.56 eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term U = 3.0 +/- 0.2 eV.
authors.affiliation: Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996-1200, USA.
authors.forename: G P
authors.initials: GP
authors.lastname: Zhang
authors.forename: T A
authors.initials: TA
authors.lastname: Callcott
authors.forename: G T
authors.initials: GT
authors.lastname: Woods
authors.forename: L
authors.initials: L
authors.lastname: Lin
authors.forename: Brian
authors.initials: B
authors.lastname: Sales
authors.forename: D
authors.initials: D
authors.lastname: Mandrus
authors.forename: J
authors.initials: J
authors.lastname: He