Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS.
Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of approximately 30 s per 0.3 mm(3) sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10(-4). This configuration is therefore highly efficient for fast strain mapping in thin components using a second-generation synchrotron source.
Korsunsky
Alexander M
AM
Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, UK. alexander.korsunsky@eng.ox.ac.uk
Collins
Steve P
SP
Owen
R Alexander
RA
Daymond
Mark R
MR
Achtioui
Saïda
S
James
Karen E
KE