title: Experimental observation of the characteristic relations of type-I intermittency in the presence of noise.
abstract: Recently, it has been reported that the characteristic relation of type-I intermittency in the presence of noise is deformed nontrivially as the channel width epsilon changes from the positive region to the negative. In order to verify it experimentally as a real phenomenon, we study the characteristic relations both for epsilon<0 and for epsilon>0 in a simple inductor-resistor-diode circuit that is under noisy circumstances. The experimental results agree well with the theoretical expectation that the characteristic relations are <l> proportional to epsilon(-1/4) for epsilon>0 and <l> proportional to exp(alpha/epsilon/(3/2)) for epsilon<0.
authors.affiliation: National Creative Research Initiative Center for Controlling Optical Chaos, Department of Physics, Paichai University, Taejon 302-735, Korea and Department of Physics, Sogang University, Seoul 121-742, Korea.
authors.forename: Jin-Hang
authors.initials: JH
authors.lastname: Cho
authors.forename: Myung-Suk
authors.initials: MS
authors.lastname: Ko
authors.forename: Young-Jai
authors.initials: YJ
authors.lastname: Park
authors.forename: Chil-Min
authors.initials: CM
authors.lastname: Kim