title: Optical characterization of multilayer stacks used as phase-change media of optical disk data storage.
abstract: We report results of measurements of the optical constants of the dielectric layer (ZnS-SiO2), reflecting layer (aluminum-chromium alloy), and phase-change layer (GeSbTe, AgInSbTe) used as the media of phase-change optical recording. The refractive index n and the absorption coefficient k of these materials vary to some extent with the film thickness and with the film deposition environment. We report the observed variations of optical constants among samples of differing structure and among samples fabricated in different laboratories.
authors.affiliation: Optical Sciences Center, University of Arizona, Tucson 85721, USA. rongguang.liang@kodak.com
authors.forename: Rongguang
authors.initials: R
authors.lastname: Liang
authors.forename: Chubing
authors.initials: C
authors.lastname: Peng
authors.forename: Kenichi
authors.initials: K
authors.lastname: Nagata
authors.forename: Kelly
authors.initials: K
authors.lastname: Daly-Flynn
authors.forename: Masud
authors.initials: M
authors.lastname: Mansuripur