title: Contribution of the intrinsic curvature to measured DNA persistence length.
abstract: The persistence length of DNA, a, depends both on the intrinsic curvature of the double helix and on the thermal fluctuations of the angles between adjacent base-pairs. We have evaluated two contributions to the value of a by comparing measured values of a for DNA containing a generic sequence and for an "intrinsically straight" DNA. In each 10 bp segment of the intrinsically straight DNA an initial sequence of five bases is repeated in the sequence of the second five bases, so any bends in the first half of the segment are compensated by bends in the opposite direction in the second half. The value of a for the latter DNA depends, to a good approximation, on thermal fluctuations only; there is no intrinsic curvature. The values of a were obtained from measurements of the cyclization efficiency for short DNA fragments, about 200 bp in length. This method determines the persistence length of DNA with exceptional accuracy, due to the very strong dependence of the cyclization efficiency of short fragments on the value of a. We find that the values of a for the two types of DNA fragment are very close and conclude that the contribution of the intrinsic curvature to a is at least 20 times smaller than the contribution of thermal fluctuations. The relationship between this result and the angles between adjacent base-pairs, which specify the intrinsic curvature, is analyzed.
authors.affiliation: Department of Chemistry, New York University, 31 Washington Place, New York, NY 10003, USA.
authors.forename: Maria
authors.initials: M
authors.lastname: Vologodskaia
authors.forename: Alexander
authors.initials: A
authors.lastname: Vologodskii
mesh_terms: D001483:Base Sequence; D004247:DNA / Q000737:chemistry*; D008956:Models, Chemical; D008969:Molecular Sequence Data
chemical_list: D004247:DNA