Differential interference contrast x-ray microscopy with twin zone plates.
X-ray imaging in differential interference contrast (DIC) with submicrometer optical resolution was performed by using a twin zone plate (TZP) setup generating focal spots closely spaced within the TZP spatial resolution of 160 nm. Optical path differences introduced by the sample are recorded by a CCD camera in a standard full-field imaging and by an aperture photodiode in a standard scanning transmission x-ray microscope. Applying this x-ray DIC technique, we demonstrate for both the full-field imaging and scanning x-ray microscope methods a drastic increase in image contrast (approximately 20x) for a low-absorbing specimen, similar to the Nomarski DIC method for visible-light microscopy.
Kaulich
Burkhard
B
X-Ray Microscopy Section, ELETTRA-Sincrotrone Trieste, Basovizzo-Trieste, Italy. kaulich@elettra.trieste.it
Wilhein
Thomas
T
Di
Fabrizio Enzo
FE
Romanato
Filippo
F
Altissimo
Matteo
M
Cabrini
Stefano
S
Fayard
Barbara
B
Susini
Jean
J