title: A novel shadow-imaging technique to measure charge distribution and lattice displacement.
abstract: We developed a novel shadow-imaging diffraction technique, using both non-coherent and coherent sources, based on parallel recording of diffraction intensity of many reflections to measure charge distribution and lattice displacement in crystals and in defects. Applying the method to Bi2Sr2CaCu2O8 superconductors demonstrated its unprecedented sensitivity and accuracy.
authors.affiliation: Materials Science Division, Brookhaven National Laboratory, Upton, NY 11973, USA. zhu@bnl.gov
authors.forename: Y
authors.initials: Y
authors.lastname: Zhu
authors.forename: L
authors.initials: L
authors.lastname: Wu
authors.forename: J
authors.initials: J
authors.lastname: Tafto