title: Ellipsometric investigation of rough zinc arsenide epilayers.
abstract: We report single-wavelength ellipsometric measurements of the complex index of refraction of rough Zn3As2 films on InP substrates. What we believe to be a novel technique, based on surface roughness measurements by atomic-force microscopy, is discussed to extract useful information from the ellipsometry results. The anticipated presence of a thin oxide layer is confirmed by Auger electron spectroscopy.
authors.affiliation: Department of Physics, University of Pretoria, South Africa. dbrink@postino.up.ac.za
authors.forename: Daniel J
authors.initials: DJ
authors.lastname: Brink
authors.forename: Jacobus A A
authors.initials: JA
authors.lastname: Engelbrecht