title: Critical behavior of a random diode network.
abstract: We study the percolation properties of a random diode network (RDN) which contains two kinds of directed bonds on a square lattice. This network is a special case of the random insulation-resistor-diode network. Both Monte Carlo simulations and series expansion for the percolation probability show that an estimated critical exponent, beta=0.1794+/-0.008, is different from known values for a conventional insulation-resistor-diode network. RDN belongs to neither the isotropic percolation universality class nor to the directed percolation universality, which we attribute to a difference of symmetry breakdown around the critical point.
authors.affiliation: Department of Mechanical and Intelligent Engineering, Himeji Institute of Technology, 2167, Shosha, Himeji 671-2201, Japan.
authors.forename: N
authors.initials: N
authors.lastname: Inui
authors.forename: H
authors.initials: H
authors.lastname: Kakuno
authors.forename: A Y
authors.initials: AY
authors.lastname: Tretyakov
authors.forename: G
authors.initials: G
authors.lastname: Komatsu
authors.forename: K
authors.initials: K
authors.lastname: Kameoka