title: Quantitative analysis of two-component samples using in-line hard X-ray images.
abstract: Methods for rapid quantitative phase-sensitive X-ray imaging of non-crystalline samples consisting of two distinct components are investigated. The transverse spatial distribution of the projected thickness of each component is reconstructed by computer processing of in-line images collected using synchrotron-generated hard X-rays and a position-sensitive detector with submicrometre spatial resolution. Different imaging techniques and associated image-processing algorithms are considered, with relative advantages and difficulties of each approach compared. A possible generalization of the method for the case of n-component samples is briefly discussed.
authors.affiliation: CSIRO Manufacturing Science and Technology, PB 33, Clayton South, VIC 3169, Australia. tim.gureyev@csiro.au
authors.forename: T E
authors.initials: TE
authors.lastname: Gureyev
authors.forename: A W
authors.initials: AW
authors.lastname: Stevenson
authors.forename: D M
authors.initials: DM
authors.lastname: Paganin
authors.forename: T
authors.initials: T
authors.lastname: Weitkamp
authors.forename: A
authors.initials: A
authors.lastname: Snigirev
authors.forename: I
authors.initials: I
authors.lastname: Snigireva
authors.forename: S W
authors.initials: SW
authors.lastname: Wilkins