title: Charge localization in collision-induced multiple ionization of van der Waals clusters with highly charged ions.
abstract: Charge localization in multiple ionization and fragmentation of small argon clusters is reported. The processes are initiated by interaction of the neutral cluster with highly charged Xe(q+) (5< or =q< or =25). Products are detected by means of multicoincidence time-of-flight methods. A strong dependence of the fragmentation pattern on the Xe charge state q is observed. In particular, we find evidence for formation of multiply charged atomic Ar(r+) fragment ions up to r = 7. Such high charge states have neither been observed in fission of multiply charged van der Waals clusters nor in ion-induced fragmentation of fullerenes or metal clusters. This hints at fundamentally different excitation and fragmentation dynamics.
authors.affiliation: Fachbereich Physik, Universität Osnabrück, Barbarastrasse 7, 49069 Osnabrück, Germany.
authors.forename: W
authors.initials: W
authors.lastname: Tappe
authors.forename: R
authors.initials: R
authors.lastname: Flesch
authors.forename: E
authors.initials: E
authors.lastname: Rühl
authors.forename: R
authors.initials: R
authors.lastname: Hoekstra
authors.forename: T
authors.initials: T
authors.lastname: Schlathölter