title: Critical exponents for diluted resistor networks.
abstract: An approach by Stephen [Phys. Rev. B 17, 4444 (1978)] is used to investigate the critical properties of randomly diluted resistor networks near the percolation threshold by means of renormalized field theory. We reformulate an existing field theory by Harris and Lubensky [Phys. Rev. B 35, 6964 (1987)]. By a decomposition of the principal Feynman diagrams, we obtain diagrams which again can be interpreted as resistor networks. This interpretation provides for an alternative way of evaluating the Feynman diagrams for random resistor networks. We calculate the resistance crossover exponent phi up to second order in epsilon=6-d, where d is the spatial dimension. Our result phi=1+epsilon/42+4epsilon(2)/3087 verifies a previous calculation by Lubensky and Wang, which itself was based on the Potts-model formulation of the random resistor network.
authors.affiliation: Institut für Theoretische Physik III, Heinrich-Heine-Universität, Universitätsstrasse 1, 40225 Düsseldorf, Germany.
authors.forename: O
authors.initials: O
authors.lastname: Stenull
authors.forename: H K
authors.initials: HK
authors.lastname: Janssen
authors.forename: K
authors.initials: K
authors.lastname: Oerding