Critical behavior of a random diode network.
We study the percolation properties of a random diode network (RDN) which contains two kinds of directed bonds on a square lattice. This network is a special case of the random insulation-resistor-diode network. Both Monte Carlo simulations and series expansion for the percolation probability show that an estimated critical exponent, beta=0.1794+/-0.008, is different from known values for a conventional insulation-resistor-diode network. RDN belongs to neither the isotropic percolation universality class nor to the directed percolation universality, which we attribute to a difference of symmetry breakdown around the critical point.
Inui
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Department of Mechanical and Intelligent Engineering, Himeji Institute of Technology, 2167, Shosha, Himeji 671-2201, Japan.
Kakuno
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Tretyakov
A Y
AY
Komatsu
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G
Kameoka
K
K