Quantitative analysis of two-component samples using in-line hard X-ray images.
Methods for rapid quantitative phase-sensitive X-ray imaging of non-crystalline samples consisting of two distinct components are investigated. The transverse spatial distribution of the projected thickness of each component is reconstructed by computer processing of in-line images collected using synchrotron-generated hard X-rays and a position-sensitive detector with submicrometre spatial resolution. Different imaging techniques and associated image-processing algorithms are considered, with relative advantages and difficulties of each approach compared. A possible generalization of the method for the case of n-component samples is briefly discussed.
Gureyev
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TE
CSIRO Manufacturing Science and Technology, PB 33, Clayton South, VIC 3169, Australia. tim.gureyev@csiro.au
Stevenson
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Paganin
D M
DM
Weitkamp
T
T
Snigirev
A
A
Snigireva
I
I
Wilkins
S W
SW