Determination of the elemental composition of mature wheat grain using a modified secondary ion mass spectrometer (SIMS).
An imaging secondary ion mass spectrometry system has been developed that allows the distribution of elements or ions to be superimposed on an image of the plant cell or tissue generated by ion-induced secondary electrons. This system has been evaluated by analysing the aleurone and sub-aleurone cells of mature wheat grain, showing high spatial resolution (100-200 nm) images of O-, PO(2)-, Mg+, Ca+, Na+ and K+ within the phytate granules of the aleurone, with CN- being diagnostic for proteins and C(2)- being diagnostic for starch in the starchy endosperm cells. This system should provide improved localization of elements in a range of other plant systems.
Heard
Peter J
PJ
Interface Analysis Centre, University of Bristol, Oldbury House, 121 St Michael's Hill, Bristol BS21 8BS, UK.
Feeney
Kevin A
KA
Allen
Geoffrey C
GC
Shewry
Peter R
PR
D010940:Plant Proteins / Q000032:analysis / Q000737:chemistry; D012639:Seeds / Q000737:chemistry / Q000166:cytology; D018629:Spectrometry, Mass, Secondary Ion / Q000379:methods*; D013213:Starch / Q000032:analysis / Q000737:chemistry; D014908:Triticum / Q000737:chemistry* / Q000166:cytology
D010940:Plant Proteins; D013213:Starch