Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films.
The determination of optical parameters of thin films from experimental data is a typical task in the field of optical-coating technology. The optical characterization of a single layer deposited on a substrate with known optical parameters is widely used for this purpose. Results of optical characterization are dependent on not only the choice of the thin-film model but also on the quality of experimental data. The theoretical results presented highlight the effect of systematic errors in measurement data on the determination of thin-film parameters. Application of these theoretical results is illustrated by the analysis of experimental data for magnesium fluoride thin films.
Tikhonravov
Alexander V
AV
Research Computing Center, Moscow State University, Vorob'evy Gory, Russia. tikh@tikh.srcc.msu.su
Trubetskov
Michael K
MK
Kokarev
Michael A
MA
Amotchkina
Tatiana V
TV
Duparré
Angela
A
Quesnel
Etienne
E
Ristau
Detlev
D
Günster
Stefan
S