title: Origin of trace organic contaminants adsorbed on the surface of silicon wafers in a manufacturing line.
authors: Advanced Analysis Center, Korea Institute of Science and Technology, Cheongryangri, Seoul.
authors: Hyun-Mee
authors: HM
authors: Park
authors: Young-Man
authors: YM
authors: Kim
authors: Chan Seong
authors: CS
authors: Cheong
authors: Jae-Chun
authors: JC
authors: Ryu
authors: Dai Woon
authors: DW
authors: Lee
authors: Kang-Bong
authors: KB
authors: Lee