title: Analysis of Seidel aberration by use of the discrete wavelet transform.
abstract: Seidel aberration coefficients can be expressed by Zernike coefficients. The least-squares matrix-inversion method of determining Zernike coefficients from a sampled wave front with measurement noise has been found to be numerically unstable. We present a method of estimating the Seidel aberration coefficients by using a two-dimensional discrete wavelet transform. This method is applied to analyze the wave front of an optical system, and we obtain not only more-accurate Seidel aberration coefficients, but we also speed the computation. Three simulated wave fronts are fitted, and simulation results are shown for spherical aberration, coma, astigmatism, and defocus.
authors: Institute of Optical Sciences, National Central University, Taiwan. rschang@ios.ncu.edu.tw
authors: Rong-Seng
authors: RS
authors: Chang
authors: Jin-Yi
authors: JY
authors: Sheu
authors: Ching-Huang
authors: CH
authors: Lin