title: Deconvolution of UV-VIS spectroelectrochemical thin-layer data for an EE electrochemical process.
abstract: A deconvolution method, based on Fixed Size Window Evolving Factor Analysis (FSWEFA) has been developed to analyse the spectroelectrochemical sequence of spectra obtained in OTTLE electrodes for EE electrochemical processes. The analysis of the data permits to reconstruct the concentration profiles, the spectra of the intermediates and an optical analogue of the i vs E curve.
authors.affiliation: Dipartimento di Scienze Chimiche, Università di Camerino, Via S. Agostino, 1 62032 Camerino, MC, Italy. marassi@camserv.unicam.it
authors.forename: Roberto
authors.initials: R
authors.lastname: Marassi
authors.forename: Silvia
authors.initials: S
authors.lastname: Zamponi
authors.forename: Paolo
authors.initials: P
authors.lastname: Conti
authors.forename: Silvia
authors.initials: S
authors.lastname: Lanteri
mesh_terms: D002855:Chromatography, Thin Layer; D004563:Electrochemistry / Q000295:instrumentation / Q000379:methods*; D004566:Electrodes; D005163:Factor Analysis, Statistical; D013056:Spectrophotometry, Ultraviolet