title: High-resolution transmission electron microscopy of phase formation and growth in metal-Si-Ge systems.
abstract: High-resolution transmission electron microscopy (HRTEM) in conjunction with nano-beam (NB) analysis as well as energy dispersive spectrometry analysis have been fruitfully utilized to study the interfacial reactions in the metal-Si-Ge systems. In this paper we report the results of TEM study of the phase formation and growth in Ti-Si-Ge, Cu-Si-Ge and Ni-Si-Ge systems.
authors.affiliation: Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, ROC. ljchen@mse.nthu.edu.tw
authors.forename: L J
authors.initials: LJ
authors.lastname: Chen
authors.forename: J B
authors.initials: JB
authors.lastname: Lai
authors.forename: C S
authors.initials: CS
authors.lastname: Lee