title: In-depth resolution from multifrequency Born fields scattered by a dielectric strip in the Fresnel zone.
abstract: The achievable depth resolution in reconstructing the permittivity profile of a dielectric strip under the Born approximation when data are collected in the Fresnel zone is studied. We consider a rectilinear measurement aperture and an orthogonal and centered rectilinear investigation domain. The roles of the aperture extent and frequency diversity are highlighted.
authors.affiliation: Seconda Università di Napoli, Dipartimento di Ingegneria dell'Informazione, Aversa, Italy. rocco.pierri@unina2.it
authors.forename: Rocco
authors.initials: R
authors.lastname: Pierri
authors.forename: Angelo
authors.initials: A
authors.lastname: Liseno
authors.forename: Raffaele
authors.initials: R
authors.lastname: Solimene
authors.forename: Francesco
authors.initials: F
authors.lastname: Tartaglione