Deltan/deltaT measurements performed with guided waves and their application to the temperature sensitivity of wavelength-division multiplexing filters.
Measurements of deltan/deltaT of thin films by the m-lines technique are presented. The importance of the substrate material is shown. An example of the wavelength shift of an optical thin-film filter with temperature is studied both theoretically and experimentally. The theoretical wavelength shift of a dense wavelength-division multiplexing filter is discussed.
Drouard
Emmanuel
E
Institut Fresnel, Unité Mixte de la Recherche Scientifique 6133, Ecole National Supérieure de Physique de Marseille, Domaine Universitaire de St Jérĵme, France. emmanuel.drouard@fresnel.fr
Huguet-Chantĵme
Pascal
P
Escoubas
Ludovic
L
Flory
François
F