title: Deltan/deltaT measurements performed with guided waves and their application to the temperature sensitivity of wavelength-division multiplexing filters.
abstract: Measurements of deltan/deltaT of thin films by the m-lines technique are presented. The importance of the substrate material is shown. An example of the wavelength shift of an optical thin-film filter with temperature is studied both theoretically and experimentally. The theoretical wavelength shift of a dense wavelength-division multiplexing filter is discussed.
authors.affiliation: Institut Fresnel, Unité Mixte de la Recherche Scientifique 6133, Ecole National Supérieure de Physique de Marseille, Domaine Universitaire de St Jérĵme, France. emmanuel.drouard@fresnel.fr
authors.forename: Emmanuel
authors.initials: E
authors.lastname: Drouard
authors.forename: Pascal
authors.initials: P
authors.lastname: Huguet-Chantĵme
authors.forename: Ludovic
authors.initials: L
authors.lastname: Escoubas
authors.forename: François
authors.initials: F
authors.lastname: Flory