title: Magneto-optic ellipsometry in exchange-coupled films.
abstract: Analytical representations of Jones matrices for the magneto-optic (MO) reflection in (a) a magnetic film on a magnetic substrate separated by a nonmagnetic spacer and (b) two ultrathin magnetic films separated by a nonmagnetic spacer, sandwiched between a nonmagnetic cover and a nonmagnetic substrate with arbitrary and independent orientations of magnetization, are provided. Originally isotropic media subjected to a uniform magnetization are considered. The discussion of MO response is restricted to the terms linear in the off-diagonal permittivity tensor elements, and typical situationsare illustrated numerically. The results are useful for the analysis of the experiments in MO ellipsometry and MO magnetometry of exchange-coupled magnetic ultrathin-film structures.
authors.affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan.
authors.forename: Stefan
authors.initials: S
authors.lastname: Visnovský
authors.forename: Kamil
authors.initials: K
authors.lastname: Postava
authors.forename: Tomuo
authors.initials: T
authors.lastname: Yamaguchi
authors.forename: Radek
authors.initials: R
authors.lastname: Lopusník