title: X-ray diffraction from rectangular slits.
abstract: It is shown that for micrometre-sized beams the X-ray diffraction from slits is a source of strong parasitic background, even for slits of high quality. In order to illustrate this effect, the coherent diffraction from rectangular slits has been studied in detail. A large number of interference fringes with strong visibility have been observed using a single set of slits made of polished cylinders. For very small apertures, asymmetrical slits generate asymmetrical patterns. This pattern is calculated from the theory of electromagnetic field propagation and compared with experiment in the far-field regime. The use of guard slits to remove Fraunhofer diffraction from the beam-defining slits is treated theoretically. Numerical simulations yield the optimum aperture of the guard slits with respect to the distance to the primary slits. Diffraction theory is shown to be essential to understand how to reduce the background-to-signal ratio in high-resolution experiments.
authors.affiliation: LPS, UMR-CNRS8502, U. Paris-Sud, Bat. 510, 91405 Orsay CEDEX, France.
authors.forename: D
authors.initials: D
authors.lastname: Le Bolloc'h
authors.forename: F
authors.initials: F
authors.lastname: Livet
authors.forename: F
authors.initials: F
authors.lastname: Bley
authors.forename: T
authors.initials: T
authors.lastname: Schulli
authors.forename: M
authors.initials: M
authors.lastname: Veron
authors.forename: T H
authors.initials: TH
authors.lastname: Metzger