Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast.
We present a method of image-speckle contrast for the nonprecalibration measurement of the root-mean-square roughness and the lateral-correlation length of random surfaces with Gaussian correlation. We use the simplified model of the speckle fields produced by the weak scattering object in the theoretical analysis. The explicit mathematical relation shows that the saturation value of the image-speckle contrast at a large aperture radius determines the roughness, while the variation of the contrast with the aperture radius determines the lateral-correlation length. In the experimental performance, we specially fabricate the random surface samples with Gaussian correlation. The square of the image-speckle contrast is measured versus the radius of the aperture in the 4f system, and the roughness and the lateral-correlation length are extracted by fitting the theoretical result to the experimental data. Comparison of the measurement with that by an atomic force microscope shows our method has a satisfying accuracy.
Cheng
Chuanfu
C
Chinese Academy of Sciences, Shanghai Institute of Optics and Fine Mechanics, China.
Liu
Chunxiang
C
Zhang
Ningyu
N
Jia
Tianqing
T
Li
Ruxin
R
Xu
Zhizhan
Z