Spatial fourier spectroscopy of guided modes in low-dimensional structures.
A new methodology for the study of low-dimensional thin-film structures and a new technique to determine nanolayer thickness are considered. These are based on recording and processing the changes in an angular Fourier spectrum of a light beam reflected from a prism coupler to excite the guided mode in a thin-film structure when the incident light beam intensity is increased.
Khomchenko
Alexander V
AV
Institute of Applied Optics, National Academy of Sciences of Belarus, Mogilev. avkh@physics.belpak.mogilev.by