title: Direct numerical inversion method for kinetic ellipsometric data. I. Presentation of the method and numerical evaluation.
abstract: A direct numerical inversion method for the determination of the refractive index and the thickness of the outermost layer of a thin transparent film on top of a multilayer has been developed. This method is based on a second-order Taylor decomposition of the coefficients of the Abelès matrices of the newly grown layer. The variations of the real-time spectroscopic ellipsometry data are expressed as polynomial fuctions depending on the dielectric constant and the thickness of the newly grown layer. The method is fast, capable of single-wavelength and multiwavelength inversion of continuous as well as discontinuous-index profiles, and can be adapted to many different polarimetric instruments.
authors.affiliation: Laboratoire de Physique des Interfaces et des Couches Minces, Ecole Polytechnique, Palaiseau, France.
authors.forename: Dmitri
authors.initials: D
authors.lastname: Kouznetsov
authors.forename: Alfred
authors.initials: A
authors.lastname: Hofrichter
authors.forename: Bernard
authors.initials: B
authors.lastname: Drévillon