Surface displacement imaging by interferometry with a light emitting diode.
We present an imaging technique to measure static surface displacements of electronic components. A device is supplied by a transient current that creates a variation of temperature, thus a surface displacement. To measure the latter, a setup that is based on a Michelson interferometer is used. To avoid the phenomenon of speckle and the drawbacks inherent to it, we use a light emitting diode as the light source for the interferometer. The detector is a visible CCD camera that analyzes the optical signal containing the information of surface displacement of the device. Combining images, we extract the amplitude of the surface displacement. Out-of-plane surface-displacement images of a thermoelectric device are presented.
Centre de Physique Moléculaire Optique et Hertzienne-Université Bordeau 1, Talence, France.
Stefan
S
Dilhaire
Stéphane
S
Grauby
Sébastien
S
Jorez
Luis David Patino
LD
Lopez
Jean-Michel
JM
Rampnoux
Wilfrid
W
Claeys