X-ray diffraction topography using a diffractometer with a bendable monochromator at a synchrotron radiation source.
The different properties of laboratory- and synchrotron-based double-crystal setups for X-ray topographic applications are discussed as a basis for the realization of a versatile instrument allowing the investigation of all kinds of crystals with high strain sensitivity and without any reduction in image size. It appears that the use of a bendable highly perfect monochromator (silicon) achieves this goal, through the local adaptation of Bragg angles, to compensate either dispersion or a bending of the sample.
European Synchrotron Radiation Facility (ESRF), Grenoble, France.
D
D
Altin
J
J
Härtwig
R
R
Köhler
W
W
Ludwig
M
M
Ohler
H
H
Klein