X-ray diffraction topography using a diffractometer with a bendable monochromator at a synchrotron radiation source.
The different properties of laboratory- and synchrotron-based double-crystal setups for X-ray topographic applications are discussed as a basis for the realization of a versatile instrument allowing the investigation of all kinds of crystals with high strain sensitivity and without any reduction in image size. It appears that the use of a bendable highly perfect monochromator (silicon) achieves this goal, through the local adaptation of Bragg angles, to compensate either dispersion or a bending of the sample.
Altin
D
D
European Synchrotron Radiation Facility (ESRF), Grenoble, France.
Härtwig
J
J
Köhler
R
R
Ludwig
W
W
Ohler
M
M
Klein
H
H