Determination of refractive indices of quarter-wavelength Bragg reflectors by reflectance measurements in wavelength and angular domains.
We show that all the structural properties of periodic dielectric multilayers can be accurately determined by a combined measurement of the transmission as a function of the wavelength and of the reflection as a function of the angle of incidence when the wavelength of the incident light is fixed. This method is applied to determine the structural properties of two commercial dielectric mirrors, and the results obtained are compared with a measurement of the same structural parameters by use of another technique based on the more standard optical guiding method.
Trull
Jose
J
Departament de Física i Enginyeria Nuclear, Universitat Politècnica de Catalunya, Terrassa, Spain. jose.francisco.trull@upc.es
Cojocaru
Crina
C
Massaneda
Josep
J
Vilaseca
Ramon
R
Martorell
Jordi
J