High resolution 3D x-ray diffraction microscopy.
We have imaged a 2D buried Ni nanostructure at 8 nm resolution using coherent x-ray diffraction and the oversampling phasing method. By employing a 3D imaging reconstruction algorithm, for the first time we have experimentally determined the 3D structure of a noncrystalline nanostructured material at 50 nm resolution. The 2D and 3D imaging resolution is currently limited by the exposure time and the computing power, while the ultimate resolution is limited by the x-ray wavelengths. We believe these results pave the way for the development of atomic resolution 3D x-ray diffraction microscopy.
Miao
Jianwei
J
Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford University, Stanford, California 94309-0210, USA. miao@ssrl.slac.stanford.edu
Ishikawa
Tetsuya
T
Johnson
Bart
B
Anderson
Erik H
EH
Lai
Barry
B
Hodgson
Keith O
KO
D008853:Microscopy / Q000379:methods*; D014961:X-Ray Diffraction / Q000379:methods*