High resolution 3D x-ray diffraction microscopy.
We have imaged a 2D buried Ni nanostructure at 8 nm resolution using coherent x-ray diffraction and the oversampling phasing method. By employing a 3D imaging reconstruction algorithm, for the first time we have experimentally determined the 3D structure of a noncrystalline nanostructured material at 50 nm resolution. The 2D and 3D imaging resolution is currently limited by the exposure time and the computing power, while the ultimate resolution is limited by the x-ray wavelengths. We believe these results pave the way for the development of atomic resolution 3D x-ray diffraction microscopy.
Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford University, Stanford, California 94309-0210, USA. miao@ssrl.slac.stanford.edu
Jianwei
J
Miao
Tetsuya
T
Ishikawa
Bart
B
Johnson
Erik H
EH
Anderson
Barry
B
Lai
Keith O
KO
Hodgson
D008853:Microscopy / Q000379:methods*; D014961:X-Ray Diffraction / Q000379:methods*