A feasibility study of a single event spectrometer based on semiconductor devices.
The electronics employed around particle accelerators can be disturbed or damaged because of single event effects (SEE). The most likely effect is the single event upset (SEU) which may affect all memory devices. In the case of high energy accelerators, SEUs are mostly produced by secondary charged particles generated by neutron interactions. The measurement of the energy and the lineal energy distribution of these neutron-induced charged particles was proposed. As a first approach, a commercial p-i-n photodiode was employed. This device was irradiated with thermal and monoenergetic fast neutrons. Some effects limiting the use of such a detector as a SEE spectrometer were observed, giving guidelines for the design of an application specific integrated circuit (ASIC). The possibility of creating a solid state microdosemeter by coupling the ASIC with a tissue-equivalent radiator is discussed. Moreover, the p-i-n photodiode covered with a hydrogenated plastic radiator may be employed as a proton-recoil spectrometer.
Dipartimento di Ingegneria Nucleare, Politecnico di Milano, via Ponzio 34/3, 20133 Milano, Italy. Stefano.Agosteo@Polimi.it
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S
Agosteo
A
A
Castoldi
L
L
Castellani
P
P
Colautti
G
G
D'Angelo
L
L
De Nardo
A
A
Favalli
I
I
Lippi
R
R
Martinelli
G
G
Tornielli
P
P
Zotto
D004307:Dose-Response Relationship, Radiation; D005240:Feasibility Studies; D009502:Neutrons; D012666:Semiconductors; D013057:Spectrum Analysis / Q000379:methods