A novel approach for coincidence ion mass spectrometry.
A novel approach is proposed for extracting a maximum of information from secondary ions ejected when surfaces are bombarded with keV mono or polyatomic ions. It is known that the event-by-event bombardment-detection mode allows identification of spatiotemporal relationships among individual secondary ions which in turn reveal surface composition within nanometric dimensions. We have devised a procedure for identifying spatiotemporal relationships among individual secondary ions without the requirement of pulsed sample interrogation (one single projectile at a time). The consequence of "mass separated time-of-flight mass spectrometry" is a much improved measurement duty cycle.
Center for Chemical Characterization and Analysis, Department of Chemistry, Texas A&M University, College Station, TX 77843-3144, USA.
Stanislav V
SV
Verkhoturov
Emile A
EA
Schweikert