Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology.
Information storage system that has a potentially ultrahigh storage density based on the principles of atomic force microscopy (AFM) has been developed. Micro-electro-mechanical systems (MEMS) technology plays a major role in integration and miniaturization of the standard AFM. Its potential application for ultrahigh storage density has been demonstrated by AFM with a piezoresponse mode to write and read information bits in ferroelectric Pb(Zr(x)Ti(1 - x))O3 films. With this technique, bits as small as 40 nm in diameter have been achieved, resulting in a data storage density of simply more than 200 Gb/in2. Retention loss phenomenon has also been observed and investigated by AFM in the piezoresponse mode. Finally, local piezoelectric measurements of PZT films by different processing technologies are discussed in detail.
Shi
Hyunjung
H
Stage Laboratory, Samsung Advanced Institute of Technology, Suwon, South Korea. hjshin@sait.samsung.co.kr
Hong
Seungbum
S
Moon
Jooho
J
Jeon
Jong Up
JU