title: A relocated technique of atomic force microscopy (AFM) samples and its application in molecular biology.
abstract: A kind of simple atomic force microscopy (AFM) relocated technique, which takes advantage of homemade sample locator system, is used for investigating repeatedly imaging of some specific species on the whole substrate (over 1 x 1 cm2) with resolution about 400 nm. As applications of this sample locator system, single extended DNA molecules and plasmid DNA network are shown in different AFM operational modes: tapping mode and contact mode with different tips after the substrates have been moved.
authors.affiliation: Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Jilin.
authors.forename: Aiguo
authors.initials: A
authors.lastname: Wu
authors.forename: Zhuang
authors.initials: Z
authors.lastname: Li
authors.forename: Lihua
authors.initials: L
authors.lastname: Yu
authors.forename: Hongda
authors.initials: H
authors.lastname: Wang
authors.forename: Erkang
authors.initials: E
authors.lastname: Wang
mesh_terms: D000538:Aluminum Silicates; D004247:DNA / Q000648:ultrastructure*; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D008967:Molecular Biology / Q000379:methods*; D010957:Plasmids / Q000648:ultrastructure*
chemical_list: D000538:Aluminum Silicates; D004247:DNA; C011934:mica