title: Polarized light scattering by dielectric and metallic spheres on silicon wafers.
abstract: The polarization and intensity of light scattered by monodisperse polystyrene latex and copper spheres, with diameters ranging from 92 to 218 nm, deposited on silicon substrates were measured with 442-, 532-, and 633-nm light. The results are compared with a theory for scattering by a sphere on a surface, originally developed by others [PhysicaA 137,209 (1986)], and extended to include coatings on the sphere and the substrate. The results show that accurate calculation of the scattering of light by a metal sphere requires that the near-field interaction between the sphere and its image be included in acomplete manner. The normal-incidence approximation does not suffice for this interaction, and the existence of any thin oxide layer on the substrate must be included in the calculation.
authors.affiliation: Division of Optical Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
authors.forename: Jung Hyeun
authors.initials: JH
authors.lastname: Kim
authors.forename: Sheryl H
authors.initials: SH
authors.lastname: Ehrman
authors.forename: George W
authors.initials: GW
authors.lastname: Mulholland
authors.forename: Thomas A
authors.initials: TA
authors.lastname: Germer