Mapping and control of atomic force on Si(1 1 1)square root(3) x square root(3)-Ag surface using noncontact atomic force microscope.
We demonstrated the possibility of measuring the three-dimensional force-related map with true atomic resolution between an Si tip and Si(1 1 1)square root(3) x square root(3)-Ag sample surface by measuring the tip-sample distance dependence of noncontact atomic force microscope (NC-AFM) image, i.e. atomically resolved atomic force spectroscopy. Furthermore, we demonstrated the possibility of controlling the interaction force between the atom on the tip apex and a sample atom of Si(1 1 1)square root(3) x square root(3)-Ag surface on an atomic scale by placing an Ag atom on the Si tip apex instead of Si atom.
Morita
S
S
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, Suita, Japan. smorita@ele.eng.osaka-u.ac.jp
Sugawara
Y
Y