title: Effect of small crystal tilt on atomic-resolution high-angle annular dark field STEM imaging.
abstract: Using a slightly tilted convergent electron beam, high-angle annular dark field scanning transmission electron microscopy observations have been performed of a [0 11]-oriented Si crystal. A small tilt of the crystal zone axis with respect to the coma-axis of the probe-forming lens causes a difference in intensity between bright spots of a Si dumbbell. The semiangle of the beam probe and the tilting angle with respect to the specimen hormal were determined by means of convergent beam micro-diffraction. The simulation using these parameters accounts for the image contrasts satisfactorily.
authors.affiliation: Department of Physics, Tokyo University of Science, Japan. a1299660@rs.kagu.sut.ac.jp
authors.forename: T
authors.initials: T
authors.lastname: Yamazaki
authors.forename: M
authors.initials: M
authors.lastname: Kawasaki
authors.forename: K
authors.initials: K
authors.lastname: Watanabe
authors.forename: I
authors.initials: I
authors.lastname: Hashimoto
authors.forename: M
authors.initials: M
authors.lastname: Shiojiri