title: Variation of the in-plane structure with depth revealed by grazing incidence x-ray diffraction in a thin Langmuir-Blodgett film.
abstract: Grazing incidence x-ray diffraction is used to characterize the molecular arrangement of ultrathin Langmuir-Blodgett (LB) multilayers. Using two angles of incidence of the beam allowing its penetration either throughout the complete depth of the film or only through the external layers, we show that it is possible to discriminate between the molecular packing of the deeper monolayers and that of the external monolayers of the LB film.
authors.affiliation: Laboratoire de Physique des Matériaux et des Surfaces, Université de Cergy-Pontoise, Neuville sur Oise, 95 031 Cergy-Pontoise Cedex, France.
authors.forename: V
authors.initials: V
authors.lastname: Dupres
authors.forename: S
authors.initials: S
authors.lastname: Cantin
authors.forename: F
authors.initials: F
authors.lastname: Benhabib
authors.forename: F
authors.initials: F
authors.lastname: Perrot
authors.forename: P
authors.initials: P
authors.lastname: Fontaine
authors.forename: M
authors.initials: M
authors.lastname: Goldmann