title: Semiconductor and thermoluminescent dosimetry of pulsed soft X ray plasma sources.
abstract: A multichannel detection system having a dynamic range of approximately 1 x 10(-9) Gy --20 Gy was developed with the use of commercially produced Si-photodiodes and TLDs for accurate measurement of X ray energy emitted from plasma-focus facility and from laser-produced plasmas. The proof of linearity of the employed detectors accomplished by a comparison of their responses to a broad band spectrum of X rays emitted from plasmas, is reported. It is demonstrated that TLDs irradiated with no protective filter show an incorrect response due to overloading in the sub-keV range and repopulation of dosimetric peaks induced by the UV radiation. The measurement of the power of undesirable secondary X ray sources driven by the primary plasma inside the interaction chamber was performed on the basis of analysis of space dependence of X ray intensity with respect to the assumed r(-2) decrease in the intensity far away from the plasma.
authors.affiliation: Department of Gas Lasers, Institute of Physics, ASCR, Prague, Czech Republic. krasa@fzu.cz
authors.forename: J
authors.initials: J
authors.lastname: Krása
authors.forename: A
authors.initials: A
authors.lastname: Cejnarová
authors.forename: L
authors.initials: L
authors.lastname: Juha
authors.forename: L
authors.initials: L
authors.lastname: Ryć
authors.forename: M
authors.initials: M
authors.lastname: Scholz
authors.forename: P
authors.initials: P
authors.lastname: Kubes
mesh_terms: D006358:Hot Temperature; D007834:Lasers; D008163:Luminescent Measurements; D010777:Photochemistry; D011854:Radiochemistry; D012666:Semiconductors; D012825:Silicon / Q000737:chemistry / Q000528:radiation effects; D013819:Thermoluminescent Dosimetry / Q000379:methods*; D014965:X-Rays
chemical_list: D012825:Silicon