title: Microscopic phase-shifting profilometry based on digital micromirror device technology.
abstract: A microscopic three-dimensional (3-D) shape measurement system based on digital fringe projection has been developed and experimentally investigated. A Digital Micromirror Device along with its illumination optics is integrated into a stereomicroscope, which projects computer-generated fringe patterns with a sinusoidal intensity profile through the microscope objective onto the object surface being measured. The fringe patterns deformed by the object surface are recorded by a CCD camera. The microscopic 3-D shape of the object surface is measured and reconstructed by use of a phase-shifting technique. We discuss design considerations and error analysis of the system. Experimental results successfully demonstrate the capability of this technique for surface profile measurement of rough surfaces at the micrometer level.
authors.affiliation: Department of Mechanical Engineering, State University of New York at Stony Brook, 11794-2300, USA. chenzhan@ic.sunysb.edu
authors.forename: Chengping
authors.initials: C
authors.lastname: Zhang
authors.forename: Peisen S
authors.initials: PS
authors.lastname: Huang
authors.forename: Fu-Pen
authors.initials: FP
authors.lastname: Chiang