High resolution atomic force microscopic imaging of the Si(111)-(7 x 7) surface: contribution of short-range force to the images.
Observation of the rest-atom layer of the Si(111)-(7 x 7) surface is performed by atomic force microscopy. By detecting the force due to the single chemical covalent bond formed between the tip and the sample surface, individual atoms on the layer were clearly resolved. Unprecedented high spatial resolution was achieved by setting the detection force at a small value and by reducing background forces due to the long-range interactions with the small oscillation amplitude of the cantilever and sharp probe tip.
Eguchi
Toyoaki
T
Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa, Chiba 277-8581, Japan.
Hasegawa
Y
Y