Quantitative characterisation of chemical inhomogeneities in Al-Ag using high-resolution Z-contrast STEM.
The incoherent imaging model is applied to interpret high-resolution Z-contrast micrographs. A simple method for a column-by-column resolved characterisation of Ag-rich precipitates in Al-Ag is developed. No information on the detailed imaging process is required. Evaluating the high-angle scattering intensities of Al and Ag by image analysis, the number of Ag atoms contained in individual atomic columns can be determined accurately and moreover, the thickness of the thin foil can be calculated. Multislice simulations confirm the broad validity of the incoherent imaging model for Z-contrast STEM and are used to check the method presented. Finally, the image analysis is applied to experimental Z-contrast images of Guinier-Preston zones in Al-3 at% Ag. The Ag content of the individual atomic columns can be determined with an accuracy better than +/-10%.
Erni
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R
ETH Zürich, Institute of Applied Physics, CH-8093, Zürich, Switzerland.
Heinrich
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H
Kostorz
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G