title: Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope.
abstract: A combined scanning near field optical/atomic force microscope (AFM) is used to obtain surface force measurements between a near field sensing tip and a tapered optical fibre surface, whilst simultaneously detecting the intensity of the evanescent field emanating from the fibre. The tapered optical fibre acts as a compliant sample to demonstrate the possible use of the near field intensity measurement system in determining 'real' surface separations from normal AFM surface force measurements at sub-nanometer resolution between deformable surfaces.
authors.affiliation: Particulate Fluids Processing Centre, School of Chemistry, University of Melbourne, Parkville, Vic. 3010, Australia. shaneth@unimelb.edu.au
authors.forename: S T
authors.initials: ST
authors.lastname: Huntington
authors.forename: P G
authors.initials: PG
authors.lastname: Hartley
authors.forename: J
authors.initials: J
authors.lastname: Katsifolis
mesh_terms: D000465:Algorithms; D018625:Microscopy, Atomic Force / Q000379:methods*; D055095:Optics and Photonics / Q000295:instrumentation*; D011827:Radiation; D013499:Surface Properties