title: Study on tip-substrate interactions by STM and APFIM.
abstract: Processes occurring at the interface of two materials coming in contact, separating or moving with respect to each other have been studied with the scanning tunnelling microscope (STM) and atom-probe (AP) field ion microscopy (APFIM). STM probe tips have been first characterised by field ion microscopy (FIM), brought into well-defined contact in the STM and afterwards inspected by time-of-flight AP. The results from mechanical contact and indentation experiments, showing material transfer and neck formation, are in reasonable good agreement with computer-based simulations on metal tip-surface interactions.
authors.affiliation: Institute of Solid State Physics, Graz University of Technology, Petersgasse 16, A-8010, Graz, Austria.
authors.forename: A
authors.initials: A
authors.lastname: Fian
authors.forename: M
authors.initials: M
authors.lastname: Leisch