title: First tests of a dipole lens for a scanning electron microscope.
abstract: We have previously shown that a dipole lens has superior properties that are particularly suited for use in a low voltage scanning electron microscope (SEM) (Tsai & Crewe, 1996). The aberrations are lower than for any other type of lens and lead to a prediction of high resolution. We describe the construction details of a microscope based on this principle and present some early results.
authors.affiliation: The Enrico Fermi Institute, The University of Chicago, 5640 South Ellis Avenue, IL 60637, USA.
authors.forename: A V
authors.initials: AV
authors.lastname: Crewe
authors.forename: O H
authors.initials: OH
authors.lastname: Kapp