title: High Q-factor Bragg-reflection sapphire-loaded cavity TE01delta mode resonators.
abstract: An innovative method of enhancing the quality factor of TE01delta cavity resonators with a dielectric tube made of monolithic sapphire is presented. Very high Q-factor is achieved by employing a Bragg reflection technique. A TE01delta mode in a copper cavity was measured to have a Q-factor of 1 x 10(5) at 8.78 GHz and 290 K. This is only 30% less than the limit due to the loss tangent of the dielectric material. The technique confines electromagnetic energy in the sapphire dielectric and in the vacuum well away from the cavity walls, thus reducing the surface losses in the copper shield. The technique offers some significant advantages over other methods. One advantage is the very low spurious mode density, which can improve filter and resonator design capabilities. Another is the small compact design, with a single sapphire piece, as compared to previously published Bragg reflection techniques. Finite element simulations and experimental data for this method were compared and found to be in very good agreement. The cavity dimensions were optimized to achieve maximum quality factor.
authors.affiliation: Frequency Standards and Metrology Research Group, School of Physics, University of Western Australia, Crawley, WA 6009, Australia. john@physics.uwa.edu.au
authors.forename: John G
authors.initials: JG
authors.lastname: Hartnett
authors.forename: Michael E
authors.initials: ME
authors.lastname: Tobar
authors.forename: Dominique
authors.initials: D
authors.lastname: Cros
authors.forename: Jerzy
authors.initials: J
authors.lastname: Krupka
authors.forename: Pierre
authors.initials: P
authors.lastname: Guillon
mesh_terms: D000537:Aluminum Oxide; D003198:Computer Simulation; D004867:Equipment Design; D019544:Equipment Failure Analysis; D020342:Finite Element Analysis; D008872:Microwaves; D008962:Models, Theoretical; D011138:Polytetrafluoroethylene; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity; D013685:Telecommunications / Q000295:instrumentation*; D013696:Temperature; D014159:Transducers
chemical_list: D011138:Polytetrafluoroethylene; D000537:Aluminum Oxide