title: X-ray interferometry with microelectronvolt resolution.
abstract: We demonstrate an interferometer for hard x rays with two back-reflecting sapphire crystal mirrors--a prototype x-ray Fabry-Pérot interferometer. A finesse of 15 and 0.76 mu eV broad Fabry-Pérot transmission resonances are measured by the time response of the interferometer. Interference patterns are observed directly in spectral dependences of reflectivity.
authors.affiliation: Institut für Experimentalphysik, Universität Hamburg, D-22761 Germany. Yuri.Shvydko@desy.de
authors.forename: Yu V
authors.initials: YV
authors.lastname: Shvyd'ko
authors.forename: M
authors.initials: M
authors.lastname: Lerche
authors.forename: H-C
authors.initials: HC
authors.lastname: Wille
authors.forename: E
authors.initials: E
authors.lastname: Gerdau
authors.forename: M
authors.initials: M
authors.lastname: Lucht
authors.forename: H D
authors.initials: HD
authors.lastname: Rüter
authors.forename: E E
authors.initials: EE
authors.lastname: Alp
authors.forename: R
authors.initials: R
authors.lastname: Khachatryan