title: Atomic Force Microscopy and Scanning Electron Microscopy Reveal Genome-dependent Ultrastructure of Seed Surface.
abstract: Both scanning electron microscopy (SEM) and contact mode imaging via atomic force microscopy (AFM) have been utilized to elucidate the ultrastructure of mung bean seed surfaces. The results indicate: 1) that AFM is useful in the examination of seed surface ultrastructure ex-vaccuo without the need for additional complex preparative procedures; and 2) that both the cotyledon and seed coat of different strains of mung beans bear specific ultrastructural details unique to each strain. To our knowledge, these are the first AFM images of seed surfaces.
authors.affiliation: University Science Instrumentation Center, Electron Microscope Centre, University College of Science, University of Calcutta, 92 Acharya Prafulla Chandra Road, Calcutta 700 009, India.
authors.forename: T.
authors.initials: T
authors.lastname: Guha
authors.forename: R.
authors.initials: R
authors.lastname: Bhar
authors.forename: V.
authors.initials: V
authors.lastname: Ganesan
authors.forename: A.
authors.initials: A
authors.lastname: Sen
authors.forename: R.L.
authors.initials: RL
authors.lastname: Brahmachary