title: Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization.
abstract: We present a procedure for the optical characterization of thin-film stacks from spectrophotometric data. The procedure overcomes the intrinsic limitations arising in the numerical determination of many parameters from reflectance or transmittance spectra measurements. The key point is to use all the information available from the manufacturing process in a single global optimization process. The method is illustrated by a case study of solgel applications.
authors.affiliation: Department Física Aplicada i Optica, Universitat de Barcelona, Diagonal 647, 08028 Barcelona, Spain.
authors.forename: Jordi
authors.initials: J
authors.lastname: Sancho-Parramon
authors.forename: Josep
authors.initials: J
authors.lastname: Ferré-Borrull
authors.forename: Salvador
authors.initials: S
authors.lastname: Bosch
authors.forename: Maria Christina
authors.initials: MC
authors.lastname: Ferrara