title: Amorphous silicon, flat-panel, x-ray detector versus storage phosphor-based computed radiography: contrast-detail phantom study at different tube voltages and detector entrance doses.
abstract: OBJECTIVE
  Evaluation of the contrast-detail performance of an active-matrix flat-panel x-ray detector in comparison with a storage phosphor system with special regard to the potential of dose reduction.
  
  
  METHODS
  A digital x-ray detector based on cesium iodide (CsI) and amorphous silicon (a-Si) technology was compared with a fifth-generation storage phosphor system. A lucite plate with 36 drilled holes of varying diameters and depths was used as contrast-detail phantom. At 45 kVp, 70 kVp, and 113 kVp, images at 8 different detector entrance doses ranging between 0.3 microGy and 40 microGy were obtained. On soft-copy displays, 3 masked observers evaluated the detectability of each aperture in each image according to a 5-point scale. The mean sum scores of corresponding images were compared.
  
  
  RESULTS
  For all tube voltages and detector entrance doses, the images obtained with the CsI/a-Si detector resulted in better observer contrast-detail performance as compared with the images of the storage phosphor system. The CsI/a-Si system allowed a calculated dose reduction of 39% at 45 kVp, 68% at 70 kVp, and 81% at 113 kVp as compared with the storage phosphor system, without loss of contrast-detail detectability.
  
  
  CONCLUSIONS
  Under the conditions of the chosen experimental design, the CsI/a-Si system provided a superior contrast-detail performance as compared with the storage phosphor system. The potential of dose reduction increased with rising tube voltage.
authors.affiliation: Department of Diagnostic Radiology, University Hospital of Regensburg, Germany. okka.hamer@klinik.uni-regensburg.de
authors.forename: Okka W
authors.initials: OW
authors.lastname: Hamer
authors.forename: Markus
authors.initials: M
authors.lastname: Völk
authors.forename: Zorger
authors.initials: Z
authors.lastname: Zorger
authors.forename: Stefan
authors.initials: S
authors.lastname: Feuerbach
authors.forename: Michael
authors.initials: M
authors.lastname: Strotzer
mesh_terms: D002586:Cesium; D006801:Humans; D007454:Iodides; D019047:Phantoms, Imaging; D010758:Phosphorus; D011856:Radiographic Image Enhancement / Q000295:instrumentation*; D012825:Silicon; D014057:Tomography, X-Ray Computed / Q000295:instrumentation* / Q000379:methods; D014963:X-Ray Intensifying Screens
chemical_list: D007454:Iodides; D002586:Cesium; D010758:Phosphorus; C040050:cesium iodide; D012825:Silicon