title: Near-field measurement of short-range correlation in optical waves transmitted through random media.
abstract: Two-dimensional near-field images of speckle patterns formed by optical waves transmitted through a disordered porous silica glass sample are measured. The corresponding 2D intensity correlation function, C, is extracted. The subwavelength spatial resolution of near-field microscopy allows us to resolve in the spatial distribution of C the expected subwavelength oscillations and to follow their dependence on the excitation wavelength. Finally, we deduce the effective refractive index of the material by fitting the theoretical spatial dependence of C to our experimental results.
authors.affiliation: INFM and LENS, Via Nello Carrara 1, 50019 Firenze, Italy. emiliani@lens.unifi.it
authors.forename: V
authors.initials: V
authors.lastname: Emiliani
authors.forename: F
authors.initials: F
authors.lastname: Intonti
authors.forename: D
authors.initials: D
authors.lastname: Wiersma
authors.forename: M
authors.initials: M
authors.lastname: Colocci
authors.forename: M
authors.initials: M
authors.lastname: Cazayous
authors.forename: A
authors.initials: A
authors.lastname: Lagendijk
authors.forename: F
authors.initials: F
authors.lastname: Aliev
mesh_terms: D008027:Light; D008433:Mathematics; D008853:Microscopy / Q000379:methods; D020527:Microscopy, Scanning Probe; D055095:Optics and Photonics; D012031:Refractometry; D012822:Silicon Dioxide / Q000737:chemistry
chemical_list: D012822:Silicon Dioxide