title: Theory of total-internal-reflection tomography.
abstract: A method is presented to reconstruct three-dimensional tomographic images of weakly scattering objects with subwavelength resolution. The method may be applied to data available in phase-sensitive, total-internal-reflection microscopy. The results follow from an analysis of the near-field inverse scattering problem with evanescent waves.
authors.affiliation: Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61821, USA. carney@uiuc.edu
authors.forename: P Scott
authors.initials: PS
authors.lastname: Carney
authors.forename: John C
authors.initials: JC
authors.lastname: Schotland