title: Profilometry based on two-photon absorption in a silicon avalanche photodiode.
abstract: A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach-Zehnder interferometer.
authors.affiliation: Department of Electrical and Electronic Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei-shi, Tokyo 184-8588, Japan. tyosuke@cc.tuat.ac.jp
authors.forename: Yosuke
authors.initials: Y
authors.lastname: Tanaka
authors.forename: Naoya
authors.initials: N
authors.lastname: Sako
authors.forename: Takashi
authors.initials: T
authors.lastname: Kurokawa
authors.forename: Hiroyuki
authors.initials: H
authors.lastname: Tsuda
authors.forename: Mitsuo
authors.initials: M
authors.lastname: Takeda