Profilometry based on two-photon absorption in a silicon avalanche photodiode.
A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach-Zehnder interferometer.
Tanaka
Yosuke
Y
Department of Electrical and Electronic Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei-shi, Tokyo 184-8588, Japan. tyosuke@cc.tuat.ac.jp
Sako
Naoya
N
Kurokawa
Takashi
T
Tsuda
Hiroyuki
H
Takeda
Mitsuo
M