Defining the parameters of a cantilever tip AFM by reference structure.
A method of measurement and control of atomic force microscope (AFM) probe parameters is offered. The AFM real cantilever parameters are defined.
Bykov
V A
VA
Nanotechnology MDT, Zelenograd, Moscow, Russia.
Novikov
Yu A
YA
Rakov
A V
AV
Shikin
S M
SM