title: Defining the parameters of a cantilever tip AFM by reference structure.
abstract: A method of measurement and control of atomic force microscope (AFM) probe parameters is offered. The AFM real cantilever parameters are defined.
authors.affiliation: Nanotechnology MDT, Zelenograd, Moscow, Russia.
authors.forename: V A
authors.initials: VA
authors.lastname: Bykov
authors.forename: Yu A
authors.initials: YA
authors.lastname: Novikov
authors.forename: A V
authors.initials: AV
authors.lastname: Rakov
authors.forename: S M
authors.initials: SM
authors.lastname: Shikin