title: High-resolution near-field Raman microscopy of single-walled carbon nanotubes.
abstract: We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of approximately 25 nm. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube.
authors.affiliation: The Institute of Optics, University of Rochester, Rochester, New York 14627, USA.
authors.forename: Achim
authors.initials: A
authors.lastname: Hartschuh
authors.forename: Erik J
authors.initials: EJ
authors.lastname: Sánchez
authors.forename: X Sunney
authors.initials: XS
authors.lastname: Xie
authors.forename: Lukas
authors.initials: L
authors.lastname: Novotny