title: Local plasticity of Al thin films as revealed by x-ray microdiffraction.
abstract: Grain-to-grain interactions dominate the plasticity of Al thin films and establish effective length scales smaller than the grain size. We have measured large strain distributions and their changes under plastic strain in 1.5-microm-thick Al 0.5% Cu films using a 0.8-microm-diameter white x-ray probe at the Advanced Light Source. Strain distributions arise not only from the distribution of grain sizes and orientation, but also from the differences in grain shape and from stress environment. Multiple active glide plane domains have been found within single grains. Large grains behave like multiple smaller grains even before a dislocation substructure can evolve.
authors.affiliation: Agere Systems, Lucent Technologies, Murray Hill, New Jersey 07974, USA. spolenak@mf.mpg.de
authors.forename: R
authors.initials: R
authors.lastname: Spolenak
authors.forename: W L
authors.initials: WL
authors.lastname: Brown
authors.forename: N
authors.initials: N
authors.lastname: Tamura
authors.forename: A A
authors.initials: AA
authors.lastname: MacDowell
authors.forename: R S
authors.initials: RS
authors.lastname: Celestre
authors.forename: H A
authors.initials: HA
authors.lastname: Padmore
authors.forename: B
authors.initials: B
authors.lastname: Valek
authors.forename: J C
authors.initials: JC
authors.lastname: Bravman
authors.forename: T
authors.initials: T
authors.lastname: Marieb
authors.forename: H
authors.initials: H
authors.lastname: Fujimoto
authors.forename: B W
authors.initials: BW
authors.lastname: Batterman
authors.forename: J R
authors.initials: JR
authors.lastname: Patel