title: Width determination of SiO2-films in Si-based devices using low-loss EFTEM: image contrast as a function of sample thickness.
abstract: Energy filtering transmission electron microscopy (EFTEM) has become one of the most efficient tools for specimen characterization at nanometer length scales. EFTEM imaging is most often carried out in the core-loss region but image intensity becomes more and more a limiting factor with decreasing feature size. Alternatively, it is possible to record EFTEM images in the low-loss region, where intensities are essentially higher and where in many cases the images contain material specific contrasts. In this paper we investigate the influence of the important parameters on the material contrast between silicon and silicon dioxide, e.g. specimen thickness, specimen orientation, energy-loss and energy selecting slit width. We show that sample thickness plays an important role and present two methods to calculate material contrast as a function of energy-loss and sample thicknesses. The first method uses spectra taken from both materials at different sample thickness by electron energy-loss spectroscopy, the second calculates contrast directly from a series of energy filtered images. From the results we determine the ideal acquisition parameters for the Si/SiO(2) system and demonstrate imaging at sufficient resolution below 2nm with a test sample of thin SiO(2) layers on Si.
authors.affiliation: Research Institute for Electron Microscopy, Graz University of Technology, Austria.
authors.forename: Bernhard
authors.initials: B
authors.lastname: Schaffer
authors.forename: Werner
authors.initials: W
authors.lastname: Grogger
authors.forename: Ferdinand
authors.initials: F
authors.lastname: Hofer