Substrate-strain-induced tunability of dense wavelength-division multiplexing thin-film filters.
Classic dense wavelength-division multiplexing thin-film filters can be spectrally tuned through the substrate's strain. We analyze the theoretical shift of the design wavelength of a narrow-bandpass filter when uniform, uniaxial compressive stress is applied to the substrate, and we compare calculated sensitivity with experimental data. We measure the transmittance shape of a 200-GHz standard filter for several loading cases to quantify the increase of insertion losses.
Parmentier
Rémy
R
Institut Fresnel, Unité Mixte de Recherche 6133 du Centre National de la Recherche Scientifique, Ecole Nationale Supérieure de Physique de Marseille, Domaine Universitaire de Saint-Jérôme, 13397 Marseille Cedex 20, France. remy.parmentier@fresnel.fr
Lequime
Michel
M