title: Spectroscopic evidence for hydrogen diffusion through a several-nanometers-thick titanium carbonitride layer on silicon.
abstract: Multiple internal reflection Fourier transform infrared spectroscopy, together with other analytical techniques, was used to follow the diffusion of atomic hydrogen through a 10-nm-thick titanium carbonitride layer deposited onto a Si(100)-2x1 surface from tetrakis(dimethylamino)titanium as a chemical vapor deposition precursor. The recombinative desorption of hydrogen from the TiCN/Si interface was shown to coincide with the temperature range where most Ti-based diffusion barriers break down.
authors.affiliation: Department of Chemistry and Biochemistry, University of Delaware, Newark, Delaware 19716, USA.
authors.forename: Semyon
authors.initials: S
authors.lastname: Bocharov
authors.forename: Andrew V
authors.initials: AV
authors.lastname: Teplyakov