title: Layer spacings in coherently strained epitaxial metal films.
abstract: Laterally resolved measurements of the quantum size effect (QSE) in electron reflectivity are made with low energy electron microscopy on coherently strained Ag films on a W(110) surface. The evolution of the total film thickness with increasing number of atomic layers is determined accurately by dynamical theory analysis of the QSE features. Combined with a model of layer spacings obtained from first-principles calculations, this provides for a novel approach to determine the buried interface layer spacing, which is inaccessible to other methods.
authors.affiliation: Department of Physics, Hong Kong University of Science and Technology, Hong Kong, China.
authors.forename: W F
authors.initials: WF
authors.lastname: Chung
authors.forename: Y J
authors.initials: YJ
authors.lastname: Feng
authors.forename: H C
authors.initials: HC
authors.lastname: Poon
authors.forename: C T
authors.initials: CT
authors.lastname: Chan
authors.forename: S Y
authors.initials: SY
authors.lastname: Tong
authors.forename: M S
authors.initials: MS
authors.lastname: Altman