title: MSTAR: a submicrometer absolute metrology system.
abstract: The Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor permits absolute distance measurement with subnanometer accuracy, an improvement of 4 orders of magnitude over current techniques. The system uses fast phase modulators to resolve the integer cycle ambiguity of standard interferometers. The concept is described and demonstrated over target distances up to 1 m. The design can be extended to kilometer-scale separations.
authors.affiliation: Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109, USA. oliver.p.lay@jpl.nasa.gov
authors.forename: O P
authors.initials: OP
authors.lastname: Lay
authors.forename: S
authors.initials: S
authors.lastname: Dubovitsky
authors.forename: R D
authors.initials: RD
authors.lastname: Peters
authors.forename: J P
authors.initials: JP
authors.lastname: Burger
authors.forename: S W
authors.initials: SW
authors.lastname: Ahn
authors.forename: W H
authors.initials: WH
authors.lastname: Steier
authors.forename: H R
authors.initials: HR
authors.lastname: Fetterman
authors.forename: Y
authors.initials: Y
authors.lastname: Chang