Angle-resolved soft X-ray emission and absorption spectroscopy of hexagonal boron nitride.
Angle-resolved soft X-ray emission and absorption spectra in the BK and NK regions of hexagonal BN were measured using polarized synchrotron radiation. The take-off/incident-angle-dependence on the spectral features in both X-ray emission and absorption is clearly observed. The configuration of the sigma and pi orbitals, which were calculated using discrete variational (DV)-Xalpha molecular orbital calculations, explains the angle-resolved soft X-ray emission and absorption spectra. The relative peak intensity of the 394-eV peak in the NK X-ray emission provides useful information about the BN layer ordering.
Muramatsu
Yasuji
Y
Kansai Research Establishment, Japan Atomic Energy Research Institute (JAERI), 1-1-1 Kouto, Mikazuki, Sayo-gun, Hyogo 679-5148, Japan. murama@spring8.or.jp
Kaneyoshi
Takahiro
T
Gullikson
Eric M
EM
Perera
Rupert C C
RC
D001896:Boron Compounds / Q000737:chemistry*; D002623:Chemistry Techniques, Analytical / Q000379:methods*; D013057:Spectrum Analysis; D014965:X-Rays
D001896:Boron Compounds; C017282:boron nitride