title: Angle-resolved soft X-ray emission and absorption spectroscopy of hexagonal boron nitride.
abstract: Angle-resolved soft X-ray emission and absorption spectra in the BK and NK regions of hexagonal BN were measured using polarized synchrotron radiation. The take-off/incident-angle-dependence on the spectral features in both X-ray emission and absorption is clearly observed. The configuration of the sigma and pi orbitals, which were calculated using discrete variational (DV)-Xalpha molecular orbital calculations, explains the angle-resolved soft X-ray emission and absorption spectra. The relative peak intensity of the 394-eV peak in the NK X-ray emission provides useful information about the BN layer ordering.
authors.affiliation: Kansai Research Establishment, Japan Atomic Energy Research Institute (JAERI), 1-1-1 Kouto, Mikazuki, Sayo-gun, Hyogo 679-5148, Japan. murama@spring8.or.jp
authors.forename: Yasuji
authors.initials: Y
authors.lastname: Muramatsu
authors.forename: Takahiro
authors.initials: T
authors.lastname: Kaneyoshi
authors.forename: Eric M
authors.initials: EM
authors.lastname: Gullikson
authors.forename: Rupert C C
authors.initials: RC
authors.lastname: Perera
mesh_terms: D001896:Boron Compounds / Q000737:chemistry*; D002623:Chemistry Techniques, Analytical / Q000379:methods*; D013057:Spectrum Analysis; D014965:X-Rays
chemical_list: D001896:Boron Compounds; C017282:boron nitride