title: Circuit for the measurement of small phase delays in MIT.
abstract: A single-channel MIT measuring system for obtaining phase delays is given. The circuit, which is described in detail, uses a high-frequency analogue multiplier to measure the phase difference between the signal and a reference signal. The noise in the phase measurement is approximately 1.5 millidegree when the time constant of measuring is 0.1 s, and the drift over about 1 day is approximately 10 millidegree.
authors.affiliation: Department of Physics and Astronomy, Cardiff University, PO Box 915, Cardiff, UK.
authors.forename: W
authors.initials: W
authors.lastname: Gough
mesh_terms: D004566:Electrodes; D004582:Electronics, Medical / Q000295:instrumentation*; D006801:Humans; D008280:Magnetics / Q000295:instrumentation*; D013997:Time Factors; D014054:Tomography / Q000295:instrumentation*