Dielectric susceptibility of wall adjacent nitrobenzene layers.
Measurements of thickness dependence of dielectric susceptibility of nitrobenzene interlayers formed on conductive substrates were carried out. The obtained data were processed under the assumption of existence of dimers (with opposite directions of molecular dipole moments) in orientationally ordered wall-adjacent layers. The value of the orientationally ordered layer thickness coincides with the one determined by other methods.
Popovskii
Yu M
YM
Odessa State Maritime Academy, Didrikhsona 8, 65100, Odessa, Ukraine.
Goryuk
A A
AA
D055592:Biophysical Phenomena; D001703:Biophysics; D019281:Dimerization; D004583:Electrons; D009578:Nitrobenzenes / Q000737:chemistry*
D009578:Nitrobenzenes; C036077:nitrobenzene