title: Improving triplet-phase accuracy by symmetry observations in reference-beam diffraction measurements.
abstract: The reference-beam X-ray diffraction technique allows parallel measurements of many three-beam interference profiles in a modified rotating-crystal experiment. Because of the unique symmetry relations that exist in the reference-beam geometry, a complete 360 degrees rotation leads to a fourfold redundancy of any given triplet phase delta(H) involving primary reflection H, reference reflection G and coupling reflection H-G, measured in a data set. Two such redundant measurements correspond to simple duplications with the reciprocal node H going into and coming out of the Ewald sphere, while the other two correspond to the Friedel mate G-H of the coupling reflection H-G passing through the Ewald sphere in a similar fashion. It is shown that substantial differences may exist between the H and the G-H cases, with an enhanced triplet-phase interference effect in one of them. These symmetry-related observations, coupled with inverse-beam triplet measurements, would improve the phase measurement accuracy of the reference-beam diffraction technique.
authors.affiliation: Cornell High Energy Synchrotron Source (CHESS) and Department of Materials Science and Engineering, Wilson Laboratory, Cornell University, Ithaca, NY 14853, USA. qs11@cornell.edu
authors.forename: Qun
authors.initials: Q
authors.lastname: Shen
mesh_terms: D018360:Crystallography, X-Ray; D008962:Models, Theoretical; D012399:Rotation; D014961:X-Ray Diffraction / Q000379:methods*