title: Comparison of phase noise simulation techniques on a BJT LC oscillator.
abstract: The phase noise resulting from white and flicker noise in a bipolar junction transistor (BJT) LC oscillator is investigated. Large signal transient time domain SPICE simulations of phase noise resulting from the random-phase flicker and white noise in a 2 GHz BJT LC oscillator have been performed and demonstrated. The simulation results of this new technique are compared with Eldo RF and Spectre RF based on linear circuit concepts and experimental result reported in the literature.
authors.forename: Leonard
authors.initials: L
authors.lastname: Forbes
authors.forename: Chengwei
authors.initials: C
authors.lastname: Zhang
authors.forename: Binglei
authors.initials: B
authors.lastname: Zhang
authors.forename: Yudi
authors.initials: Y
authors.lastname: Chandra