title: Characterization of layered scattering media using polarized light measurements and neural networks.
abstract: Measurements of the spatial distributions of polarized light backscattered from a two-layer scattering medium are used to train a neural network. We investigated whether the absorption coefficients and thickness of the layer can be determined when the scattering properties are known. When determining the absorption of the upper layer or the layer's thickness, polarized light measurements provide better performance than unpolarized measurements, demonstrating the sensitivity of polarized light to superficial tissue. Determination of the lower layer's absorption coefficient is not improved by polarized light measurements. Prior knowledge of the tissue under investigation is also beneficial because errors are reduced if the range of absorption or thickness is restricted.
authors.affiliation: University of Nottingham, School of Electrical and Electronic Engineering, University Park, Nottingham, NG7 2RD, UK. steve.morgan@nottingham.ac.uk
authors.forename: Kai Y
authors.initials: KY
authors.lastname: Yong
authors.forename: Stephen P
authors.initials: SP
authors.lastname: Morgan
authors.forename: Ian M
authors.initials: IM
authors.lastname: Stockford
authors.forename: Mark C
authors.initials: MC
authors.lastname: Pitter
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D008859:Microscopy, Polarization / Q000379:methods*; D008954:Models, Biological; D016571:Neural Networks, Computer; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity