Evaluation of bent-crystal x-ray backlighting and microscopy techniques for the Sandia Z machine.
X-ray backlighting and microscopy systems for the 1-10-keV range based on spherically or toroidally bent crystals are discussed. These systems are ideal for use on the Sandia Z machine, a megajoule-class x-ray facility. Near-normal-incidence crystal microscopy systems have been shown to be more efficient than pinhole cameras with the same spatial resolution and magnification [Appl. Opt. 37, 1784 (1998)]. We show that high-resolution (< or = 10 microm) x-ray backlighting systems using bent crystals can be more efficient than analogous point-projection imaging systems. Examples of bent-crystal-backlighting results that demonstrate 10-microm resolution over a 20-mm field of view are presented.
Sinars
Daniel B
DB
Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185-1193, USA. dbsinar@sandia.gov
Bennett
Guy R
GR
Wenger
David F
DF
Cuneo
Michael E
ME
Porter
John L
JL