title: Layer-doubling method in ADF-STEM image simulation.
abstract: A layer-doubling method developed in LEED calculation is applied to the ADF-STEM image simulation. This approach makes it possible to simulate image intensities of systems having a repeated slab structure, such as embedded precipitates or defects, with a much higher efficiency because it does not require the diagonalization of repeated slabs. As a simple example of this method, channeling effects are calculated for a system with embedded crystalline displaced slabs for various different slab thicknesses.
authors.affiliation: National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0003, Ibaraki, Japan. mitsuishi.kazutaka@nims.go.jp
authors.forename: K
authors.initials: K
authors.lastname: Mitsuishi
authors.forename: M
authors.initials: M
authors.lastname: Takeguchi
authors.forename: Y
authors.initials: Y
authors.lastname: Toda
authors.forename: K
authors.initials: K
authors.lastname: Furuya