title: Characterization of Co25Ag75 and (Co90Al10)28Ag72 granular films by electron diffraction, high-resolution transmission electron microscopy and electron spectroscopic imaging.
abstract: Series of sputter-deposited Co25Ag75 and (Co90Al10)28Ag72 giant-magnetoresistance granular films were characterized by electron diffraction, high-resolution transmission electron microscopy and electron spectroscopic imaging. Crystalline particles of fcc silver and hcp cobalt were detected in both thin-film systems before annealing. Annealing of (Co90Al10)28Ag72 films at 773 and 823 K yielded mixtures of fcc and hcp cobalt clusters and notably enlarged silver particles. In addition, crystallites of bcc Ag3Al were detected in the sample annealed at 823 K. The mesoscopic structure of the as-deposited films was investigated by dark-field imaging showing columnar growth-domains for silver. The columns were preserved during thermal treatment up to 773 K, whereas annealing at 823 K destroyed these domains.
authors.affiliation: Institute for Materials Science, Darmstadt University of Technology, Petersenstrasse 23, D-64283 Darmstadt, Germany. rmoksuzoglu@selcuk.edu.tr
authors.forename: R Mustafa
authors.initials: RM
authors.lastname: Oksüzoglu
authors.forename: Thomas E
authors.initials: TE
authors.lastname: Weirich
authors.forename: Hartmut
authors.initials: H
authors.lastname: Fuess
mesh_terms: D000497:Alloys / Q000737:chemistry; D017607:Aluminum Compounds / Q000737:chemistry*; D003035:Cobalt / Q000737:chemistry*; D003461:Crystallography; D007089:Image Enhancement; D008280:Magnetics; D008420:Manufactured Materials / Q000032:analysis; D008854:Microscopy, Electron; D012822:Silicon Dioxide / Q000737:chemistry; D018030:Silver Compounds / Q000737:chemistry*; D013057:Spectrum Analysis / Q000379:methods; D014961:X-Ray Diffraction
chemical_list: D000497:Alloys; D017607:Aluminum Compounds; D018030:Silver Compounds; D003035:Cobalt; D012822:Silicon Dioxide