title: Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy.
abstract: New experiments made possible with a commercial transmission electron microscope (TEM) equipped with a high-resolution electron energy loss spectrometer (EELS) are presented. With this commercial system, a 100 meV energy resolution using a sub 2 nm probe or 500 meV at a 0.20 nm probe are possible, in combination with other modern techniques available for TEMs. In this paper a number of explorative examples of the first results are shown. The benefit of the increased resolution for detecting more details in near edge structures are shown for the Ti K edge in TiO(2) (brookite) and for the N K edge in cubic and hexagonal GaN. The bandgap of GaN is studied in both crystal structures, as well as the dependency of the low-loss spectrum on the momentum transfer direction in diffraction mode.
authors.affiliation: National Centre for HREM, Department of Technical Sciences, Delft University of Technology, Laboratory for Materials Science, Rotterdamseweg 137, Delft 2628 AL, The Netherlands.
authors.forename: S
authors.initials: S
authors.lastname: Lazar
authors.forename: G A
authors.initials: GA
authors.lastname: Botton
authors.forename: M-Y
authors.initials: MY
authors.lastname: Wu
authors.forename: F D
authors.initials: FD
authors.lastname: Tichelaar
authors.forename: H W
authors.initials: HW
authors.lastname: Zandbergen