title: Localization in elastic and inelastic scattering.
abstract: The degree of information localization in elastic and inelastic scattering is examined in the context of imaging zone axis crystals in the aberration corrected STEM. We show that detector geometry is a critical factor in determining the localization, and compare a number of different geometries. Experimental core loss line traces demonstrate strong EELS localization at the titanium L-edge, even in the presence of dynamical elastic scattering.
authors.affiliation: Solid State Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831-6031, USA. gaz@ornl.gov
authors.forename: A R
authors.initials: AR
authors.lastname: Lupini
authors.forename: S J
authors.initials: SJ
authors.lastname: Pennycook