title: Evaluation of bent-crystal x-ray backlighting and microscopy techniques for the Sandia Z machine.
abstract: X-ray backlighting and microscopy systems for the 1-10-keV range based on spherically or toroidally bent crystals are discussed. These systems are ideal for use on the Sandia Z machine, a megajoule-class x-ray facility. Near-normal-incidence crystal microscopy systems have been shown to be more efficient than pinhole cameras with the same spatial resolution and magnification [Appl. Opt. 37, 1784 (1998)]. We show that high-resolution (< or = 10 microm) x-ray backlighting systems using bent crystals can be more efficient than analogous point-projection imaging systems. Examples of bent-crystal-backlighting results that demonstrate 10-microm resolution over a 20-mm field of view are presented.
authors.affiliation: Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185-1193, USA. dbsinar@sandia.gov
authors.forename: Daniel B
authors.initials: DB
authors.lastname: Sinars
authors.forename: Guy R
authors.initials: GR
authors.lastname: Bennett
authors.forename: David F
authors.initials: DF
authors.lastname: Wenger
authors.forename: Michael E
authors.initials: ME
authors.lastname: Cuneo
authors.forename: John L
authors.initials: JL
authors.lastname: Porter