Atomic structure of InSb(001) and GaAs(001) surfaces imaged with noncontact atomic force microscopy.
Noncontact atomic force microscopy (NC-AFM) has been used to study the c(8x2) InSb(001) and the c(8x2) GaAs(001) surfaces prepared by sputter cleaning and annealing. Atomically resolved tip-surface interaction maps display different characteristic patterns depending on the tip front atom type. It is shown that representative AFM maps can be interpreted consistently with the most recent structural model of A(III)B(V)(001) surface, as corresponding to the A(III) sublattice, to the B(V) sublattice, or to the combination of both sublattices.
Kolodziej
J J
JJ
Institute of Physics, Jagiellonian University, Reymonta 4, 30-059 Kraków, Poland.
Such
B
B
Szymonski
M
M
Krok
F
F