Development of an optical refractometer by analysis of one-dimensional photonic bandgap structures with defects.
A theoretical analysis of an optical fiber photonic-bandgap-based refractometer is presented. The design is based on a quarter-wave reflector with one defect. By modifying both the real and the imaginary parts of the index of refraction of the defects we begin to change either the frequency or the amplitude of the localized optical mode. So we could fabricate a specific optical fiber refractometer by combining all the variables: index of refractive index of the defects and the rest of layers, thickness of the defect, number of layers, etc. to yield a large set of design possibilities, for example, detecting wider or thinner ranges of refractive indices, or controlling the detection accuracy. Some rules for the practical implementation of the refractometer are given.
Matías
Ignacio R
IR
Departamento de Ingeniería Eléctrica y Eletrónica, Universidad Pública de Navarra, 31006 Pamplona, Spain.
Del Villar
Ignacio
I
Arregui
Francisco J
FJ
Claus
Richard O
RO