Structural effects of Ti underlayer on CoCrPt magnetic films.
The effects of long-range and short-range orders of Ti underlayer thickness on the magnetic properties of sputtered Co72 Cr21 Pt7 films were investigated using synchrotron X-ray scattering and X-ray absorption near-edge structure spectroscopy. The results were consistent with that of magnetic measurements and X-ray photoelectron spectroscopy. For thin Ti underlayers (10 nm), the oxidation of Ti and significant mixing of other elements within this underlayer did not promote texture development, further resulting in poor texturing of magnetic films and undesirable magnetic properties. Increased crystallinity and texture of metallic Ti in thicker underlayers enhanced the magnetic peak alignment and its properties.
Sun
C J
CJ
Department of Materials Science, National University of Singapore, Data Storage Institute, Kent Ridge, Singapore, Republic of Singapore.
Chow
G M
GM
Soo
E W
EW
Wang
J P
JP
Hwu
Y K
YK
Cho
T S
TS
Je
J H
JH
Lee
H H
HH
Kim
J W
JW
Noh
D Y
DY
D002858:Chromium Alloys / Q000737:chemistry* / Q000302:isolation & purification; D003460:Crystallization / Q000379:methods*; D003461:Crystallography / Q000379:methods; D007854:Lead / Q000737:chemistry*; D008280:Magnetics; D008422:Materials Testing / Q000379:methods; D008567:Membranes, Artificial; D008968:Molecular Conformation; D036103:Nanotechnology / Q000379:methods*; D013329:Structure-Activity Relationship; D014025:Titanium / Q000737:chemistry*
D002858:Chromium Alloys; D008567:Membranes, Artificial; D007854:Lead; D014025:Titanium