Grating-enhanced through-wafer optical microprobe for microelectromechanical system high-resolution optical position feedback.
We present modeling and experimental results from the use of a 1310-nm-wavelength through-wafer optical microprobe in conjunction with a microstructure grating to monitor the motion of a lateral comb resonator stage. The optical signal that results from shuttle interaction with the microprobe beam exhibits a peak-to-valley dynamic range that corresponds to 2-microm microstructure displacement, facilitating submicrometer positional resolution on digitization. This signal was used to achieve microstructure positional feedback and effective microsystem model parameter extraction, which are essential for structure control and model-based fault detection.
Dawson
J M
JM
Microelectronic Systems Research Center and Electromechanical Systems Research Laboratory, Lane Department of Computer Science and Electrical Engineering, West Virginia University, Morgantown, West Virginia 26506-6109, USA. dawson@csee.wvu.edu
Wang
L
L
Famouri
P
P
Hornak
L A
LA