Diffraction and line shape of Fourier-transform spectrometers.
The effect of diffraction the instrument line shape of a Fourier-transform spectrometer is studied with an analytical line-shape model. The expression for the instrument line shape of a diffracted point source is obtained. A simple condition on the throughput of the instrument is derived under which diffraction is negligible when compared with the field-of-view-induced line shape. The effect of diffraction is illustrated and compared for various instruments.
Genest
Jérôme
J
Centre d'optique, photonique et laser, Département de génie electrique et de genie informatique, Université Laval, Québec, Canada G1K 7P4. jgenest@site.uottawa.ca
Tremblay
Pierre
P