title: High resolution EELS using monochromator and high performance spectrometer: comparison of V2O5 ELNES with NEXAFS and band structure calculations.
abstract: Using single crystal V2O5 as a sample, we tested the performance of the new aberration corrected GATAN spectrometer on a monochromatised 200 kV FEG FEI (S)TEM. The obtained V L and O K ELNES were compared with that obtained in a common GATAN GIF and that in the new spectrometer, without monochromatised beam. The performance of the new instrumentation is impressive: recorded with an energy-resolution of 0.22 eV, the V L(3) edge reveals all the features due to the bulk electronic structure, that are also revealed in near-edge X-ray absorption fine structure (NEXAFS) with a much higher energy-resolution (0.08 eV). All features of the ELNES and NEXAFS are in line with a theoretical spectrum derived from band-structure calculations.
authors.affiliation: Department of Inorganic Chemistry, Fritz-Haber-Institute of the Max-Planck-Society, D-14195 Berlin, Germany. dangsheng@fhi-berlin.mpg.de
authors.forename: D S
authors.initials: DS
authors.lastname: Su
authors.forename: H W
authors.initials: HW
authors.lastname: Zandbergen
authors.forename: P C
authors.initials: PC
authors.lastname: Tiemeijer
authors.forename: G
authors.initials: G
authors.lastname: Kothleitner
authors.forename: M
authors.initials: M
authors.lastname: Hävecker
authors.forename: C
authors.initials: C
authors.lastname: Hébert
authors.forename: A
authors.initials: A
authors.lastname: Knop-Gericke
authors.forename: B H
authors.initials: BH
authors.lastname: Freitag
authors.forename: F
authors.initials: F
authors.lastname: Hofer
authors.forename: R
authors.initials: R
authors.lastname: Schlögl