A simple approach to the determination of the crystallographic orientation: applications and accuracy.
A simple analytical solution for the crystallographic orientation is described. This method is based on one indexed Kikuchi pair in a known zone rather than the corresponding diffraction spots. The accuracy of this method is shown to be better than 0.1 degrees even for cases in which a zone axis deviates by a large angle (e.g. 10 degrees ) from the centre of the beam direction. This approach simplifies experiments because only one pair of Kikuchi lines and a zone axis are needed, and is especially suited when it is difficult or cumbersome to resolve a second pair of Kikuchi lines with sufficient accuracy.
Wang
S C
SC
Materials Research Group, School of Engineering Sciences, The University of Southampton SO17 1BJ, U.K. wangs@soton.ac.uk
Starink
M J
MJ