Fundamental device design considerations in the development of disruptive nanoelectronics.
In the last quarter of a century silicon-based integrated circuits (ICs) have played a major role in the growth of the economy throughout the world. A number of new technologies, such as quantum computing, molecular computing, DNA molecules for computing, etc., are currently being explored to create a product to replace semiconductor transistor technology. We have examined all of the currently explored options and found that none of these options are suitable as silicon IC's replacements. In this paper we provide fundamental device criteria that must be satisfied for the successful operation of a manufacturable, not yet invented, device. The two fundamental limits are the removal of heat and reliability. The switching speed of any practical man-made computing device will be in the range of 10(-15) to 10(-3) s. Heisenberg's uncertainty principle and the computer architecture set the heat generation limit. The thermal conductivity of the materials used in the fabrication of a nanodimensional device sets the heat removal limit. In current electronic products, redundancy plays a significant part in improving the reliability of parts with macroscopic defects. In the future, microscopic and even nanoscopic defects will play a critical role in the reliability of disruptive nanoelectronics. The lattice vibrations will set the intrinsic reliability of future computing systems. The two critical limits discussed in this paper provide criteria for the selection of materials used in the fabrication of future devices. Our work shows that diamond contains the clue to providing computing devices that will surpass the performance of silicon-based nanoelectronics.
Singh
R
R
Center for Silicon Nanoelectronics, Holcombe Department of Electrical and Computer Engineering, Clemson University, Clemson, South Carolina 29634-0915, USA.
Poole
J O
JO
Poole
K F
KF
Vaidya
S D
SD
D003201:Computers; D003657:Decision Making; D018130:Diamond / Q000737:chemistry; D004581:Electronics / Q000295:instrumentation / Q000379:methods*; D004867:Equipment Design / Q000379:methods*; D019544:Equipment Failure Analysis; D006358:Hot Temperature; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D015203:Reproducibility of Results; D012666:Semiconductors; D012680:Sensitivity and Specificity; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation; D012825:Silicon / Q000737:chemistry; D013673:Technology Assessment, Biomedical / Q000379:methods*
D018130:Diamond; D012825:Silicon