title: Repairable-conditionally repairable damage model based on dual Poisson processes.
abstract: The advent of intensity-modulated radiation therapy makes it increasingly important to model the response accurately when large volumes of normal tissues are irradiated by controlled graded dose distributions aimed at maximizing tumor cure and minimizing normal tissue toxicity. The cell survival model proposed here is very useful and flexible for accurate description of the response of healthy tissues as well as tumors in classical and truly radiobiologically optimized radiation therapy. The repairable-conditionally repairable (RCR) model distinguishes between two different types of damage, namely the potentially repairable, which may also be lethal, i.e. if unrepaired or misrepaired, and the conditionally repairable, which may be repaired or may lead to apoptosis if it has not been repaired correctly. When potentially repairable damage is being repaired, for example by nonhomologous end joining, conditionally repairable damage may require in addition a high-fidelity correction by homologous repair. The induction of both types of damage is assumed to be described by Poisson statistics. The resultant cell survival expression has the unique ability to fit most experimental data well at low doses (the initial hypersensitive range), intermediate doses (on the shoulder of the survival curve), and high doses (on the quasi-exponential region of the survival curve). The complete Poisson expression can be approximated well by a simple bi-exponential cell survival expression, S(D) = e(-aD) + bDe(-cD), where the first term describes the survival of undamaged cells and the last term represents survival after complete repair of sublethal damage. The bi-exponential expression makes it easy to derive D(0), D(q), n and alpha, beta values to facilitate comparison with classical cell survival models.
authors.affiliation: Medical Radiation Physics, Department of Oncology-Pathology, Karolinska Institutet, Stockholm University, SE-171 76 Stockholm, Sweden. bengt.lind@radfys.ki.se
authors.forename: B K
authors.initials: BK
authors.lastname: Lind
authors.forename: L M
authors.initials: LM
authors.lastname: Persson
authors.forename: M R
authors.initials: MR
authors.lastname: Edgren
authors.forename: I
authors.initials: I
authors.lastname: Hedlöf
authors.forename: A
authors.initials: A
authors.lastname: Brahme
mesh_terms: D002460:Cell Line; D002470:Cell Survival / Q000528:radiation effects*; D004249:DNA Damage; D004260:DNA Repair; D019583:Dose Fractionation, Radiation; D004307:Dose-Response Relationship, Radiation; D006801:Humans; D015233:Models, Statistical; D008962:Models, Theoretical; D016012:Poisson Distribution; D011878:Radiotherapy / Q000009:adverse effects / Q000379:methods*