[The analysis of UV absorption spectrum and X-ray diffraction spectrum of Sn-doped C60 thin films].
In this article, We report our measured results of UV-Vis absorption, X-ray diffraction and scanning electron microscope for Sn-doped C60 thin film. The results show the two absorption peaks in respective short wave range of UV absorption have an apparent decline after doping Sn, and the position of three absorption peaks have a slightly shift respectively to red wave direction. The electron absorption transition of Sn-C60 film is indirect transition, and there are impurity levels in the energy band; X-ray diffraction shows that the crystal structure of Sn-C60 film is f. c. c. The film is in the form of tiny drops in nano magnitude.
Wu
Chun-yan
CY
Department of Physics, Guangdong University of Technology, Guangzhou 510090, China.
Zhong
Shao
S
Chen
Yi-ming
YM
Zhang
Hai-yan
HY
He
Yan-yang
YY
Zhu
Yan-juan
YJ
D000042:Absorption; D004563:Electrochemistry; D037741:Fullerenes / Q000737:chemistry*; D008855:Microscopy, Electron, Scanning; D036103:Nanotechnology; D013056:Spectrophotometry, Ultraviolet; D014001:Tin / Q000737:chemistry*; D014961:X-Ray Diffraction
D037741:Fullerenes; D014001:Tin; C069837:fullerene C60