title: Imaging interferometric microscopy.
abstract: We introduce and demonstrate a new microscopy concept: imaging interferometric microscopy (IIM), which is related to holography, synthetic-aperture imaging, and off-axis-dark-field illumination techniques. IIM is a wavelength-division multiplex approach to image formation that combines multiple images covering different spatial-frequency regions to form a composite image with a resolution much greater than that permitted by the same optical system using conventional techniques. This new type of microscopy involves both off-axis coherent illumination and reinjection of appropriate zero-order reference beams. Images demonstrate high resolution, comparable with that of a high-numerical-aperture (NA) objective, while they retain the long working distance, the large depth of field, and the large field of view of a low-NA objective. A Fourier-optics model of IIM is in good agreement with the experiment.
authors.affiliation: Center for High Technology Materials and Department of Physics and Astronomy, University of New Mexico, MSC04 2710, 1313 Goddard SE, Albuquerque, New Mexico 87106, USA.
authors.forename: Christian J
authors.initials: CJ
authors.lastname: Schwarz
authors.forename: Yuliya
authors.initials: Y
authors.lastname: Kuznetsova
authors.forename: S R J
authors.initials: SR
authors.lastname: Brueck