Scanning electron microscope evaluation of two methods of resharpening periodontal curets: a comparative study.
BACKGROUND
Effective root planing demands sharp cutting edges on dental curets. However, after several strokes, they become dull and must be resharpened frequently. The purpose of this study was to evaluate by scanning electron microscopy (SEM) the quality of the cutting edge of periodontal curets resharpened by 2 different methods.


METHODS
Forty new detachable Gracey curets were used in this study. After similar blunting, all instruments were resharpened either with 10 strokes using an Arkansas fine-grit sharpening stone (AR), or with 7 strokes using a high-grit and -density aluminum oxide stone (CH). The cutting edges of each instrument were examined using SEM at 1 mm and 2 mm from the tip before and after the resharpening procedure. Bevel measurement and the amount of functional and non-functional wire edges (WE) on the cutting edge were evaluated. Data were statistically analyzed using analysis of variance (ANOVA) with repeated measures, 2-way ANOVA, and Fisher's exact test.


RESULTS
After blunting and resharpening, differences in bevel between groups were statistically non-significant. Generally, after resharpening, there were significantly more functional and non-functional WE in the AR group than in the CH group. There were significantly more instruments with a complete absence of WE in the CH group.


CONCLUSIONS
The CH stone resulted in a smoother and better cutting edge than the AR stone. The procedure was easy to perform and required fewer strokes of the curet on the stone.
Moses
Ofer
O
Department of Periodontology, The Maurice and Gabriela Goldschleger School of Dental Medicine, Tel Aviv University, Tel Aviv, Israel.
Tal
Haim
H
Artzi
Zvi
Z
Sperling
Alon
A
Zohar
Ron
R
Nemcovsky
Carlos E
CE
D000537:Aluminum Oxide / Q000737:chemistry; D000704:Analysis of Variance; D003475:Curettage / Q000295:instrumentation*; D006801:Humans; D008855:Microscopy, Electron, Scanning; D016745:Root Planing / Q000295:instrumentation*; D013499:Surface Properties
D000537:Aluminum Oxide