title: [The analysis of UV absorption spectrum and X-ray diffraction spectrum of Sn-doped C60 thin films].
abstract: In this article, We report our measured results of UV-Vis absorption, X-ray diffraction and scanning electron microscope for Sn-doped C60 thin film. The results show the two absorption peaks in respective short wave range of UV absorption have an apparent decline after doping Sn, and the position of three absorption peaks have a slightly shift respectively to red wave direction. The electron absorption transition of Sn-C60 film is indirect transition, and there are impurity levels in the energy band; X-ray diffraction shows that the crystal structure of Sn-C60 film is f. c. c. The film is in the form of tiny drops in nano magnitude.
authors.affiliation: Department of Physics, Guangdong University of Technology, Guangzhou 510090, China.
authors.forename: Chun-yan
authors.initials: CY
authors.lastname: Wu
authors.forename: Shao
authors.initials: S
authors.lastname: Zhong
authors.forename: Yi-ming
authors.initials: YM
authors.lastname: Chen
authors.forename: Hai-yan
authors.initials: HY
authors.lastname: Zhang
authors.forename: Yan-yang
authors.initials: YY
authors.lastname: He
authors.forename: Yan-juan
authors.initials: YJ
authors.lastname: Zhu
mesh_terms: D000042:Absorption; D004563:Electrochemistry; D037741:Fullerenes / Q000737:chemistry*; D008855:Microscopy, Electron, Scanning; D036103:Nanotechnology; D013056:Spectrophotometry, Ultraviolet; D014001:Tin / Q000737:chemistry*; D014961:X-Ray Diffraction
chemical_list: D037741:Fullerenes; D014001:Tin; C069837:fullerene C60