title: [Development and application of software in EDXRF spectrometer].
abstract: The present paper describes application softwares on file management system, multicomponent linear regression, rapid semi-quantitative analysis, analysis of coating thickness and multifunctional Lucas-tooth intensity correction, developed in EDXRF. Utilization of these software improves the analytical quality, management efficiency and development ability of scientific research.
authors.affiliation: Qi Shuyan Locomotive and Rolling-Stock Technological Institute, Ministry of Railways, Changzhou 213001, China.
authors.forename: K
authors.initials: K
authors.lastname: Cai
mesh_terms: D002857:Chromium / Q000032:analysis; D017076:Computer-Aided Design; D007091:Image Processing, Computer-Assisted; D016014:Linear Models; D008331:Management Information Systems; D009532:Nickel / Q000032:analysis; D012825:Silicon / Q000032:analysis; D012984:Software; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods
chemical_list: D002857:Chromium; D009532:Nickel; D012825:Silicon