title: Measurements of contact potential difference (work functions) of metals and semiconductors surface by the static ionized capacitor method.
abstract: Electron work functions of several metals (Au, W, Ag, Cu, Mo, Ti, Al) and Si at atmospheric conditions have been measured by the method of the static capacitor with an ionized gap between the electrodes. Results for all samples, excluding Au, Al and Si, conform to reference data with an accuracy of +/- 1.0%. For samples Au, Al and Si, the electron work function values conform to reference data after short-time heat treatment at atmospheric conditions at 200 degrees C (for Al) and 600 degrees C (for Au, Si).
authors.affiliation: Moscow Institute of Electronics Engineering, Technical University, Moscow, Russia.
authors.forename: Sergey Nikolaevich
authors.initials: SN
authors.lastname: Novikov
authors.forename: Sergey Petrovich
authors.initials: SP
authors.lastname: Timoshenkov
mesh_terms: D000535:Aluminum / Q000737:chemistry; D004563:Electrochemistry / Q000379:methods*; D004583:Electrons; D006046:Gold / Q000737:chemistry; D007477:Ions; D008670:Metals / Q000737:chemistry*; D010100:Oxygen / Q000378:metabolism; D012825:Silicon / Q000737:chemistry; D013696:Temperature; D013997:Time Factors; D014867:Water / Q000737:chemistry
chemical_list: D007477:Ions; D008670:Metals; D014867:Water; D006046:Gold; D000535:Aluminum; D010100:Oxygen; D012825:Silicon