title: [Spectral emissivity of thin films].
abstract: In this paper, the contribution of multiple reflections in thin film to the spectral emissivity of thin films of low absorption is discussed. The expression of emissivity of thin films derived here is related to the thin film thickness d and the optical constants n(lambda) and k(lambda). It is shown that in the special case d-->infinity the emissivity of thin films is equivalent to that of the bulk material. Realistic numerical and more precise general numerical results for the dependence of the emissivity on d, n(lambda) and k(lambda) are given.
authors.affiliation: Physics Department of Liaoning University, 110036 Shenyang.
authors.forename: D
authors.initials: D
authors.lastname: Zhong
mesh_terms: D000042:Absorption; D000465:Algorithms; D055598:Chemical Phenomena; D002627:Chemistry, Physical; D055590:Electromagnetic Phenomena; D005373:Film Dosimetry / Q000295:instrumentation / Q000379:methods*; D005374:Filtration / Q000295:instrumentation; D008962:Models, Theoretical; D011874:Radiometry / Q000379:methods; D012031:Refractometry; D013057:Spectrum Analysis; D013472:Sunlight