title: Effects of interface roughness on the spectral properties of thin films and multilayers.
abstract: We introduce two parameters, large-scale and small-scale rms roughness, to take into account the interface properties of thin films and multilayers in the calculation of their specular reflectance and transmittance. A theoretical motivation for the introduction of these two parameters instead of a standard single rms roughness is provided. Experimental power spectral density functions of several samples are used to illustrate ways in which the parameters introduced can be evaluated.
authors.affiliation: Research Computing Center, Moscow State University, Leninskie Gory, 119992, Moscow, Russia. tikh@tikh.srcc.msu.su
authors.forename: Alexander V
authors.initials: AV
authors.lastname: Tikhonravov
authors.forename: Michael K
authors.initials: MK
authors.lastname: Trubetskov
authors.forename: Andrei A
authors.initials: AA
authors.lastname: Tikhonravov
authors.forename: Angela
authors.initials: A
authors.lastname: Duparré