title: [A reflection interference method for determining optical constants and thickness of a thin solid film].
abstract: In this paper we report a simple method for deducing optical constants and thickness from the reflection interference spectrum of a thin transparent film which is on a substrate of high reflection coefficient. When a light beam is incident on the surface of the film, the reflection light beams at the front and rear faces are coherent. We calculated the optical constants and thickness of the film from the reflection spectrum. This simple method makes a directly programmable calculation possible.
authors.affiliation: Department of Physics, Fudan University, State Key Laboratory for Materials Modification by Laser, Ion and Electron Beams, 200433 Shanghai.
authors.forename: P
authors.initials: P
authors.lastname: Yang
authors.forename: Z
authors.initials: Z
authors.lastname: Xu
authors.forename: L
authors.initials: L
authors.lastname: Xu