Effects of interface roughness on the spectral properties of thin films and multilayers.
We introduce two parameters, large-scale and small-scale rms roughness, to take into account the interface properties of thin films and multilayers in the calculation of their specular reflectance and transmittance. A theoretical motivation for the introduction of these two parameters instead of a standard single rms roughness is provided. Experimental power spectral density functions of several samples are used to illustrate ways in which the parameters introduced can be evaluated.
Tikhonravov
Alexander V
AV
Research Computing Center, Moscow State University, Leninskie Gory, 119992, Moscow, Russia. tikh@tikh.srcc.msu.su
Trubetskov
Michael K
MK
Tikhonravov
Andrei A
AA
Duparré
Angela
A