title: Aluminum position in Rb-feldspar as determined by X-ray photoelectron spectroscopy.
abstract: Al/Si configurations in some natural and synthetic Rb-feldspars have been examined carefully by EMPA and XPS analyses. Our results indicate that a small amount of H2O and excess Si and Al are incorporated in hydrothermally synthesized Rb-feldspar. The quantities of excess Al are 0.056 atoms per formula unit and are negatively correlated with those of the Rb, suggesting the presence of excess Al occupying non-tetrahedral sites in feldspar structures. This leads to incorporation of Al(Al3Si)O8 endmember into Rb-feldspars, estimated as one appropriate endmember indication for unusual chemistry of feldspars. In addition, Si2p, Al2p and O1s XPS signals of Rb-feldspars shift drastically toward the higher energy side than those of any natural feldspars. These provide conclusive evidence not only for existence of perceptible excess Si and Al, but also for Al at both extra-framework and tetrahedral sites in feldspar structures.