title: Dynamic scaling, island size distribution, and morphology in the aggregation regime of submonolayer pentacene films.
abstract: Scaling behavior of the island size distribution through a universal scaling function f(u) is demonstrated for submonolayer pentacene islands in the aggregation regime (0.1<theta<0.5) grown on oxidized silicon surfaces. The distribution of f(u) suggests that four molecules constitute the smallest stable island. The structure factor S(k) of the submonolayer films calculated from AFM micrographs compares well with diffuse x-ray intensities from in situ experiments. The structure factor was decomposed into the contribution from the average island shape and the interisland distribution confirming that a unique characteristic length scale regulates the growth dynamics.
authors.affiliation: Vanderbilt University, Department of Physics and Astronomy, Nashville, Tennessee 37235, USA.
authors.forename: Ricardo
authors.initials: R
authors.lastname: Ruiz
authors.forename: Bert
authors.initials: B
authors.lastname: Nickel
authors.forename: Norbert
authors.initials: N
authors.lastname: Koch
authors.forename: Leonard C
authors.initials: LC
authors.lastname: Feldman
authors.forename: Richard F
authors.initials: RF
authors.lastname: Haglund
authors.forename: Antoine
authors.initials: A
authors.lastname: Kahn
authors.forename: Fereydoon
authors.initials: F
authors.lastname: Family
authors.forename: Giacinto
authors.initials: G
authors.lastname: Scoles