title: Diffraction anomalous fine-structure spectroscopy at beamline BM2 at the European Synchrotron Radiation Facility.
abstract: Diffraction anomalous fine-structure (DAFS) spectroscopy uses resonant elastic X-rays scattering as an atomic, shell and site-selective probe that provides information on the electronic structure and the local atomic environment as well as on the long-range-ordered crystallographic structure. A DAFS experiment consists of measuring the Bragg peak intensities as a function of the energy of the incoming X-ray beam. The French CRG (Collaborative Research Group) beamline BM2-D2AM (Diffraction Diffusion Anomale Multi-longueurs d'Onde) at the ESRF (European Synchrotron Radiation Facility) has developed a state-of-the-art energy scan diffraction set-up. In this article the requirements for obtaining reliable DAFS data are presented and recent technical achievements are reported.
authors.affiliation: Laboratoire de Cristallographie, Centre National de la Recherche Scientifique, BP 166, F-38042 Grenoble CEDEX 09, France. hubert.renevier@cea.fr
authors.forename: H
authors.initials: H
authors.lastname: Renevier
authors.forename: S
authors.initials: S
authors.lastname: Grenier
authors.forename: S
authors.initials: S
authors.lastname: Arnaud
authors.forename: J F
authors.initials: JF
authors.lastname: Bérar
authors.forename: B
authors.initials: B
authors.lastname: Caillot
authors.forename: J L
authors.initials: JL
authors.lastname: Hodeau
authors.forename: A
authors.initials: A
authors.lastname: Letoublon
authors.forename: M G
authors.initials: MG
authors.lastname: Proietti
authors.forename: B
authors.initials: B
authors.lastname: Ravel
mesh_terms: D000465:Algorithms; D016477:Artifacts; D003461:Crystallography / Q000295:instrumentation / Q000379:methods; D004867:Equipment Design; D005060:Europe; D008968:Molecular Conformation; D011786:Quality Control; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods*; D017356:Synchrotrons / Q000295:instrumentation*; D014961:X-Ray Diffraction / Q000295:instrumentation* / Q000379:methods*