Recognizing and avoiding artifacts in AFM imaging.
Ricci
Davide
D
Department of Biophysical and Electronic Engineering, University of Genoa, Italy.
Braga
Pier Carlo
PC
D016477:Artifacts; D002516:Ceramics / Q000737:chemistry; D007091:Image Processing, Computer-Assisted; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D013499:Surface Properties