Measuring local flow velocities and biofilm structure in biofilm systems with magnetic resonance imaging (MRI).
The characterization of substrate transport in the bulk phase and in the biofilm matrix is one of the problems which has to be solved for the verification of biofilm models. Additionally, the surface structure of biofilms has to be described with appropriate parameters. Magnetic resonance imaging (MRI) is one of the promising methods for the investigation of transport phenomena and structure in biofilm systems. The MRI technique allows the noninvasive determination of flow velocities and biofilm structures with a high resolution on the sub-millimeter scale. The presented investigations were carried out for defined heterotrophic biofilms which were cultivated in a tube reactor at a Reynolds number of 2000 and 8000 and a substrate load of 6 and 4 g/m2d glucose. Magnetic resonance imaging provides both structure data of the biofilm surface and flow velocities in the bulk phase and at the bulk/biofilm interface. It is shown that the surface roughness of the biofilms can be determined in one experiment for the complete cross section of the test tubes both under flow and stagnant conditions. Furthermore, the local shear stress was calculated from the measured velocity profiles. In the investigated biofilm systems the local shear stress at the biofilm surface was up to 3 times higher compared to the mean wall shear stress calculated on the base of the mean flow velocity.
Manz
Bertram
B
Fraunhofer-Institute of Biomedical Engineering (IBMT), Ensheimer Strasse 48, D-66386 St. Ingbert, Germany.
Volke
Frank
F
Goll
Danile
D
Horn
Harald
H
D000465:Algorithms; D001419:Bacteria / Q000166:cytology*; D018407:Bacterial Physiological Phenomena; D018441:Biofilms / Q000254:growth & development*; D019149:Bioreactors / Q000382:microbiology*; D018929:Cell Culture Techniques / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted; D008279:Magnetic Resonance Imaging / Q000379:methods*; D044085:Microfluidics / Q000379:methods*; D009068:Movement; D013499:Surface Properties