title: Rotational invariants for polarized Raman spectroscopy.
abstract: A new method has been developed to determine an orientation-independent Raman scattered intensity based on various polarized Raman measurements. The equivalent term in infrared spectroscopy is the structural absorbance, which has existed for many years. As with the structural absorbance, the calculated Raman intensity allows one to observe spectral changes that are due uniquely to morphological changes in a set of different samples in the presence of orientation differences. The full theoretical development is presented, followed by an example based on a set of polymer fibers processed under different conditions leading to different morphologies and degrees of molecular orientation.
authors: Dept. of Materials Science and Engineering, University of Delaware, Newark, Delaware 19711, USA.
authors: S
authors: S
authors: Frisk
authors: R M
authors: RM
authors: Ikeda
authors: D B
authors: DB
authors: Chase
authors: J F
authors: JF
authors: Rabolt
mesh_terms: D000465:Algorithms; D016880:Anisotropy; D003198:Computer Simulation; D003460:Crystallization / Q000379:methods*; D008859:Microscopy, Polarization / Q000379:methods; D008958:Models, Molecular; D008968:Molecular Conformation; D011093:Polyethylene Terephthalates / Q000032:analysis / Q000737:chemistry* / Q000145:classification*; D017550:Spectroscopy, Fourier Transform Infrared / Q000379:methods*; D013059:Spectrum Analysis, Raman / Q000379:methods*
chemical_list: D011093:Polyethylene Terephthalates