title: Environmental effects in the third moment of voltage fluctuations in a tunnel junction.
abstract: We present the first measurements of the third moment of the voltage fluctuations in a conductor. This technique can provide new and complementary information on the electronic transport in conducting systems. The measurement was performed on nonsuperconducting tunnel junctions as a function of voltage bias, for various temperatures and bandwidths up to 1 GHz. The data demonstrate the significant effect of the electromagnetic environment of the sample.
authors: Departments of Applied Physics and Physics, Yale University, New Haven, CT 06520-8284, USA.
authors: B
authors: B
authors: Reulet
authors: J
authors: J
authors: Senzier
authors: D E
authors: DE
authors: Prober