Environmental effects in the third moment of voltage fluctuations in a tunnel junction.
We present the first measurements of the third moment of the voltage fluctuations in a conductor. This technique can provide new and complementary information on the electronic transport in conducting systems. The measurement was performed on nonsuperconducting tunnel junctions as a function of voltage bias, for various temperatures and bandwidths up to 1 GHz. The data demonstrate the significant effect of the electromagnetic environment of the sample.
Reulet
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Departments of Applied Physics and Physics, Yale University, New Haven, CT 06520-8284, USA.
Senzier
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J
Prober
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