Optimized preparation of cross-sectional TEM specimens of organic thin films.
We present a route for the preparation of cross-sectional TEM specimens of crystalline organic thin films which minimizes the mechanical, chemical and thermal load of the organic film during preparation and allows to take TEM images with molecular resolution. A typical example of a thin film of diindenoperylene capped with a thin layer of gold is shown to demonstrate the application of the technique for the investigation of metal-organic interfaces.
Dürr
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Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, D-70569 Stuttgart, Germany. arndt.duerr@mf.mpg.de
Schreiber
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Kelsch
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Dosch
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