title: Full counting statistics of multiple Andreev reflections.
abstract: We derive the full distribution of transmitted particles through a superconducting point contact of arbitrary transparency under voltage bias. The charge transport is dominated by multiple Andreev reflections. The counting statistics is a multinomial distribution of processes, in which multiple charges ne (n=1,2,3, ...) are transferred through the contact. For zero temperature we obtain analytical expressions for the probabilities of the multiple Andreev reflections. The current, shot noise, and high current cumulants in a variety of situations can be obtained from our result.
authors: Institut für Theoretische Festkörperphysik, Universität Karlsruhe, D-76128 Karlsruhe, Germany.
authors: J C
authors: JC
authors: Cuevas
authors: W
authors: W
authors: Belzig