title: Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy.
abstract: Time-resolved x-ray spectroscopy at the Si L edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.
authors: Department of Physics, University of California, Berkeley, California 94720, USA. Steve.Johnson@mailaps.org
authors: S L
authors: SL
authors: Johnson
authors: P A
authors: PA
authors: Heimann
authors: A M
authors: AM
authors: Lindenberg
authors: H O
authors: HO
authors: Jeschke
authors: M E
authors: ME
authors: Garcia
authors: Z
authors: Z
authors: Chang
authors: R W
authors: RW
authors: Lee
authors: J J
authors: JJ
authors: Rehr
authors: R W
authors: RW
authors: Falcone