title: Compensation of charging in X-PEEM: a successful test on mineral inclusions in 4.4 Ga old zircon.
abstract: We present a new differential-thickness coating technique to analyze insulating samples with X-ray PhotoElectron Emission spectroMicroscopy (X-PEEM). X-PEEM is non-destructive, analyzes the chemical composition and crystal structure of minerals and can spatially resolve chemical species with a resolution presently reaching 35 nm. We tested the differential coating by analyzing a 4.4 billion-year-old zircon (ZrSiO(4)) containing silicate inclusions. We observed quartz (SiO(2)) inclusions smaller than 1microm in size that can only be analyzed non-destructively with synchrotron spectromicroscopies. With the removal of charging we greatly extend the range of samples that can be analyzed by X-PEEM.
authors: Department of Physics and Synchrotron Radiation Center, University of Wisconsin-Madison, 3731 Schneider Drive, Stoughton, WI 53589, USA. pupa@src.wisc.edu
authors: Gelsomina
authors: G
authors: De Stasio
authors: Bradley H
authors: BH
authors: Frazer
authors: Benjamin
authors: B
authors: Gilbert
authors: Katherine L
authors: KL
authors: Richter
authors: John W
authors: JW
authors: Valley