title: Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling.
abstract: In apertureless scanning near-field optical microscopy (ASNOM), the probe vibration is often used to increase the detected signal. The useful signal is detected at the probe-vibration frequency by a lock-in amplifier. By comparing two-dimensional numerical results with an experimental scan, we show numerically that, to explain or predict the detected signal, a realistic model of ASNOM should take into account the scan of the probe as well as the probe vibration and the material properties.
authors.affiliation: Laboratoire de Nanotechnologie et d'Instrumentation Optique--Centre National de la Recherche Scientifique Formation de Recherche en Evolution 2671, 12 Rue Marie Curie BP-2060, 10010 Troyes Cedex, France.
authors.forename: Radouane
authors.initials: R
authors.lastname: Fikri
authors.forename: Thomas
authors.initials: T
authors.lastname: Grosges
authors.forename: Dominique
authors.initials: D
authors.lastname: Barchiesi