title: Atomic force microscopy imaging of hair: correlations between surface potential and wetting at the nanometer scale.
abstract: We report investigations of hair surface potential under wetting at the nanometric scale by atomic force microscopy (AFM). Surface potential imaging was used to characterize the electrostatic properties of the hair samples. We found that the surface potential noticeably increases along the edges of the cuticles. These results are correlated with wetting behavior of different liquids performed using AFM in noncontact mode.
authors.affiliation: Laboratoire de Physique des Solides, Université Paris Sud, Orsay, France.
authors.forename: Vincent
authors.initials: V
authors.lastname: Dupres
authors.forename: Terri
authors.initials: T
authors.lastname: Camesano
authors.forename: Dominique
authors.initials: D
authors.lastname: Langevin
authors.forename: Antonio
authors.initials: A
authors.lastname: Checco
authors.forename: Patrick
authors.initials: P
authors.lastname: Guenoun
mesh_terms: D006197:Hair / Q000737:chemistry* / Q000648:ultrastructure*; D006801:Humans; D018625:Microscopy, Atomic Force; D055672:Static Electricity; D013223:Statistics as Topic; D013500:Surface Tension; D017155:Wettability