[SIMS (secondary ion mass spectroscopy) and XPS (x-ray photoelectron spectroscopy) study of titanium implant surfaces coated with anodic titanium-oxide layer].
The demands that must be satisfied by titanium implants applied in medical practice include chemical and physical durability. An anodic oxide protective layer formed on the surface of titanium implants serves for the better attainment of this aim. The composition of the passivizing layer and the changes in its thickness and binding state can be studied by method of material science, e.g. by secondary ion mass spectroscopy (SIMS) and X-ray photoelectron spectroscopy (XPS). In this way a possibility arises for the material technological classification of the Ti-TiO2 layer structure and for the observation of the physical and chemical reactions that occur between the implants and the tissues in the organism. The present XPS examinations revealed that the binding state of the titanium forming the surface of the plates involve neither significant quantities of titanium oxide nor impurities. In the SIMS investigation the thickness of the titanium oxide layer was found to be 120-150 nm. Determination of the thickness of the surface, the binding state of the titanium and the exact proportions of the impurities and additives furnishes a possibility for a subsequent comparison with the surface structure of plates removed from the organism. It is important for the assessment of the practical value of the protective layer.
Suba
Csongor
C
Semmelweis Egyetem, Fogorvostudományi Kar, Szájsebészeti és Fogászati Klinika, Budapest.
Velich
Norbert
N
Vida
György
G
Kovács
Lajos
L
Kiss
Gábor
G
Szabó
György
G
D015921:Dental Implants; D004563:Electrochemistry; D006801:Humans; D008422:Materials Testing / Q000379:methods*; D018629:Spectrometry, Mass, Secondary Ion; D013052:Spectrometry, X-Ray Emission; D013499:Surface Properties; D014025:Titanium
D015921:Dental Implants; C009495:titanium dioxide; D014025:Titanium