title: Interferometric laser diode probing of micrometer- and nanometer-scale materials.
abstract: We are developing a method for real-time detection, tracking, and categorization of micrometer- and nanometer-scale particles and materials using light scattered from a swept standing-wave probe. Synchronous, phase-sensitive detection of the weakly scattered optical field is exploited to provide interferometric sensitivity and improve the signal-to-noise ratio, allowing use of low-power laser diode sources and photodiode detectors. To demonstrate the technique, we probe a set of W, C, and Cu microfibers and determine diameters and refractive-index values from a detailed comparison of light-scattering data and a numerical model. We extrapolate these results and discuss the application of laser diode sources and photodiode receivers for the detection and study of nanoscale materials.
authors.affiliation: Department of Physics and Astronomy, Texas Christian University, TCU Box 298840, Fort Worth, Texas 76129, USA.
authors.forename: Gregory W
authors.initials: GW
authors.lastname: Sherman
authors.forename: Curtis C
authors.initials: CC
authors.lastname: Bradley
mesh_terms: D000465:Algorithms; D007368:Interferometry / Q000295:instrumentation* / Q000379:methods*; D007834:Lasers; D008422:Materials Testing / Q000295:instrumentation* / Q000379:methods*; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods*; D055095:Optics and Photonics / Q000295:instrumentation; D010316:Particle Size; D012031:Refractometry / Q000295:instrumentation / Q000379:methods; D012542:Scattering, Radiation; D012666:Semiconductors; D014159:Transducers