title: Fourth- and higher-order small-perturbation solution for scattering from dielectric rough surfaces.
abstract: A recursive solution of the small-perturbation method for rough surface scattering is presented. These results permit fourth- and higher-order corrections to rough surface scattering coefficients to be determined in a form that explicitly separates surface and electromagnetic properties. Sample results are presented for the fourth-order correction to the specular reflection coefficient of a rough surface and the sixth-order correction to incoherent scattering cross sections.
authors.affiliation: Department of Electrical Engineering and ElectroScience Laboratory, The Ohio State University, 205 Dreese Laboratories, 2015 Neil Avenue, Columbus, Ohio 43210, USA.
authors.forename: Metin A
authors.initials: MA
authors.lastname: Demir
authors.forename: Joel T
authors.initials: JT
authors.lastname: Johnson