title: Quantum oscillations in the layer structure of thin metal films.
abstract: Understanding the underlying physical principles that determine the internal structure of objects at the atomic scale is critical for the advancement of nanoscale science. We have performed synchrotron x-ray diffraction studies to determine the structural properties of smooth Pb films with varying thicknesses of 6 to 18 monolayers deposited on a Si(111) substrate at 110 K. We observe quasibilayer variations in the atomic interlayer spacings of the films consistent with charge density oscillations due to quantum confinement of conduction electrons and surface-interface interference effects. Quantum oscillations in atomic step height are also deduced.
authors.affiliation: Department of Physics, University of Illinois at Urbana-Champaign, 1110 W. Green Street, Urbana, IL 61801-3080, USA.
authors.forename: P
authors.initials: P
authors.lastname: Czoschke
authors.forename: Hawoong
authors.initials: H
authors.lastname: Hong
authors.forename: L
authors.initials: L
authors.lastname: Basile
authors.forename: T-C
authors.initials: TC
authors.lastname: Chiang