Dispersion corrections of the copper K edge measured by Fresnel diffraction.
Dispersion corrections to the atomic scattering factors for the copper K edge have been measured by a new technique, Fresnel diffraction. Fresnel diffraction fringes were measured at several sample-detector distances as a function of energy across the copper K-absorption edge. The dispersion corrections were obtained from optimizing a least-squares fit of Fresnel fringe simulations to the measured data.
Lee
Wah-Keat
WK
Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439, USA. wklee@aps.anl.gov
Cloetens
Peter
P
Schlenker
Michel
M