Fourth- and higher-order small-perturbation solution for scattering from dielectric rough surfaces.
A recursive solution of the small-perturbation method for rough surface scattering is presented. These results permit fourth- and higher-order corrections to rough surface scattering coefficients to be determined in a form that explicitly separates surface and electromagnetic properties. Sample results are presented for the fourth-order correction to the specular reflection coefficient of a rough surface and the sixth-order correction to incoherent scattering cross sections.
Demir
Metin A
MA
Department of Electrical Engineering and ElectroScience Laboratory, The Ohio State University, 205 Dreese Laboratories, 2015 Neil Avenue, Columbus, Ohio 43210, USA.
Johnson
Joel T
JT