title: Resolution enhancement of pHe+ atomic line profiles measured with a pulsed dye laser and a Fizeau wavelength meter.
abstract: A Fizeau wavelength meter was used to compensate for fluctuations in the longitudinal mode structure and wavelength of a pulsed dye laser. The average laser linewidth was effectively narrowed by selection of laser pulses with a single longitudinal mode. These techniques were recently employed to measure some atomic transition wavelengths in pHe+ to fractional precisions greater than 1 part in 10(7). The wavelengths were absolutely calibrated against iodine or tellurium lines by absorption spectroscopy or against neon or argon lines by optogalvanic spectroscopy.
authors.affiliation: CERN, CH-1211 Geneva 23, Switzerland. masaki.hori@cern.ch
authors.forename: Masaki
authors.initials: M
authors.lastname: Hori
authors.forename: Ryugo S
authors.initials: RS
authors.lastname: Hayano
authors.forename: Eberhard
authors.initials: E
authors.lastname: Widmann
authors.forename: Hiroyuki A
authors.initials: HA
authors.lastname: Torii