title: Long-lived charge-separated state leading to DNA damage through hole transfer.
abstract: The hole transfer causes the long-lived charge-separated state in DNA during the photosensitized one-electron oxidation of DNA. The combination of the transient absorption measurement and DNA damage quantification by HPLC clearly demonstrated that the yield of the DNA damage correlates well with the lifetime of the charge-separated state.
authors.affiliation: The Institute of Scientific and Industrial Research (SANKEN), Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan. kiyohiko@sanken.osaka-u.ac.jp
authors.forename: Kiyohiko
authors.initials: K
authors.lastname: Kawai
authors.forename: Tadao
authors.initials: T
authors.lastname: Takada
authors.forename: Takayoshi
authors.initials: T
authors.lastname: Nagai
authors.forename: Xichen
authors.initials: X
authors.lastname: Cai
authors.forename: Akira
authors.initials: A
authors.lastname: Sugimoto
authors.forename: Mamoru
authors.initials: M
authors.lastname: Fujitsuka
authors.forename: Tetsuro
authors.initials: T
authors.lastname: Majima
mesh_terms: D002851:Chromatography, High Pressure Liquid; D004247:DNA / Q000737:chemistry* / Q000187:drug effects / Q000528:radiation effects; D004249:DNA Damage; D007094:Imides / Q000737:chemistry / Q000494:pharmacology; D009841:Oligonucleotides / Q000737:chemistry / Q000528:radiation effects; D010084:Oxidation-Reduction; D010782:Photolysis; D017319:Photosensitizing Agents / Q000737:chemistry / Q000494:pharmacology
chemical_list: D007094:Imides; D009841:Oligonucleotides; D017319:Photosensitizing Agents; D004247:DNA