Long-lived charge-separated state leading to DNA damage through hole transfer.
The hole transfer causes the long-lived charge-separated state in DNA during the photosensitized one-electron oxidation of DNA. The combination of the transient absorption measurement and DNA damage quantification by HPLC clearly demonstrated that the yield of the DNA damage correlates well with the lifetime of the charge-separated state.
Kawai
Kiyohiko
K
The Institute of Scientific and Industrial Research (SANKEN), Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan. kiyohiko@sanken.osaka-u.ac.jp
Takada
Tadao
T
Nagai
Takayoshi
T
Cai
Xichen
X
Sugimoto
Akira
A
Fujitsuka
Mamoru
M
Majima
Tetsuro
T
D002851:Chromatography, High Pressure Liquid; D004247:DNA / Q000737:chemistry* / Q000187:drug effects / Q000528:radiation effects; D004249:DNA Damage; D007094:Imides / Q000737:chemistry / Q000494:pharmacology; D009841:Oligonucleotides / Q000737:chemistry / Q000528:radiation effects; D010084:Oxidation-Reduction; D010782:Photolysis; D017319:Photosensitizing Agents / Q000737:chemistry / Q000494:pharmacology
D007094:Imides; D009841:Oligonucleotides; D017319:Photosensitizing Agents; D004247:DNA