title: Dispersion corrections of the copper K edge measured by Fresnel diffraction.
abstract: Dispersion corrections to the atomic scattering factors for the copper K edge have been measured by a new technique, Fresnel diffraction. Fresnel diffraction fringes were measured at several sample-detector distances as a function of energy across the copper K-absorption edge. The dispersion corrections were obtained from optimizing a least-squares fit of Fresnel fringe simulations to the measured data.
authors.affiliation: Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439, USA. wklee@aps.anl.gov
authors.forename: Wah-Keat
authors.initials: WK
authors.lastname: Lee
authors.forename: Peter
authors.initials: P
authors.lastname: Cloetens
authors.forename: Michel
authors.initials: M
authors.lastname: Schlenker