Theory for the measurements of dispersion characteristics in waveguiding structures with a scanning near-field optical microscope.
A theory is presented for the interpretation of scanning near-field optical microscope measurements on pulses propagating in waveguiding structures. It is shown how the dispersion characteristics of the propagating guided modes may be derived from such experiments. Then it is demonstrated how to calibrate the scanning tip position and to derive experimental values for reflection and transmission of modes in identical single-mode waveguides connected to a photonic device such as a micro cavity.
Hoekstra
Hugo J W M
HJ
Integrated Optics and Micro-Systems Group, Microelectronics, Sensors, and Actuators Research Institute, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands. h.j.w.m.hoekstra@el.utwente.nl
Klunder
Dion J W
DJ
Driessen
Alfred
A