Polarized light scattering by dielectric and metallic spheres on oxidized silicon surfaces.
The polarization and intensity of light scattered by polystyrene latex and copper spheres with diameters of approximately 100 nm deposited onto silicon substrates containing various thicknesses of oxide films were measured with 532-nm light. The results are compared with a theory for scattering by a sphere on a surface, originally developed by others [Physica A 137, 209 (1986)] and extended to include coatings on the substrate. Nonlinear least-squares fits of the theory to the observations yield results that were consistent with differential mobility measurements of the particle diameter.
Kim
Jung Hyeun
JH
National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Ehrman
Sheryl H
SH
Mulholland
George W
GW
Germer
Thomas A
TA