Electrical characterization of metal-molecule-silicon junctions.
D004553:Electric Conductivity; D004563:Electrochemistry / Q000295:instrumentation / Q000379:methods; D004581:Electronics / Q000295:instrumentation* / Q000379:methods*; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008670:Metals / Q000737:chemistry*; D008904:Miniaturization; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods*; D012666:Semiconductors; D012825:Silicon / Q000737:chemistry*; D014297:Trimethylsilyl Compounds / Q000737:chemistry*
D008670:Metals; D014297:Trimethylsilyl Compounds; D012825:Silicon