Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA.
D001483:Base Sequence; D004247:DNA / Q000032:analysis* / Q000737:chemistry*; D012313:RNA / Q000032:analysis / Q000737:chemistry; D018629:Spectrometry, Mass, Secondary Ion / Q000379:methods*; D013052:Spectrometry, X-Ray Emission / Q000379:methods*
D012313:RNA; D004247:DNA