Molecular electronics on silicon: an ultrahigh vacuum scanning tunneling microscopy study.
D003461:Crystallography / Q000379:methods; D004553:Electric Conductivity; D004559:Electric Wiring / Q000295:instrumentation / Q000379:methods; D004563:Electrochemistry / Q000295:instrumentation / Q000379:methods*; D004581:Electronics / Q000295:instrumentation* / Q000379:methods*; D019544:Equipment Failure Analysis / Q000379:methods; D016252:Microscopy, Scanning Tunneling / Q000379:methods*; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods*; D012825:Silicon / Q000737:chemistry*; D020058:Styrene / Q000737:chemistry*; D013499:Surface Properties; D014618:Vacuum
D020058:Styrene; D012825:Silicon