Smectic layer displacement fluctuations in solid substrate supported smectic-A films.
In this paper we present results of calculations of static and dynamic characteristics of smectic layer displacement fluctuations in solid substrate supported smectic-A films with due regard for asymmetric profiles of the bending elastic constant K and the smectic layer compressibility B. We also take into account difference in properties of boundary surfaces of the film, namely, the surface tension of the free surface is taken to be finite whereas that of a film-substrate interface is assumed to be infinitely large. Profiles of the smectic layer displacement fluctuations and correlations between them are calculated for films formed of liquid crystalline compounds with the bulk smectic-A to nematic phase transition. The calculations are performed at temperatures much lower than that of the bulk phase transition and at maximum temperatures of existence of films of given thickness. The time dependent displacement-displacement correlation functions for thermal smectic layer displacement fluctuations and time dependent intensity-intensity correlation functions for diffuse x-ray scattering from the films are also calculated. It is shown that unlike free-standing smectic-A films, an effect of the temperature on dynamics of smectic layer displacement fluctuations in solid substrate supported smectic-A films can be observed in experiments on coherent x-ray dynamic scattering from not very thick films (N approximately 20) and at significantly smaller wave vector transfer component in the film plane.
Institute of the Problems of Mechanical Engineering, Academy of Sciences of Russia, St. Petersburg 199178, Russia.
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Mirantsev