Model for striped growth.
We introduce a model for describing the defected growth of striped patterns. This model, while roughly related to the Swift-Hohenberg model, generates a quite different mixture of defects during phase ordering. We find two characteristic lengths in the system: the scaling length L(t), and the average width of the domain walls. The growth law exponent is larger than the value of 1/2 found in typical point defect systems.
James Franck Institute and Department of Physics, University of Chicago, Chicago, Illinois 60637, USA.
Hai
H
Qian
Gene F
GF
Mazenko