Electrical nanoprobing of semiconducting carbon nanotubes using an atomic force microscope.
We use an atomic force microscope (AFM) tip to locally probe the electronic properties of semiconducting carbon nanotube transistors. A gold-coated AFM tip serves as a voltage or current probe in three-probe measurement setup. Using the tip as a movable current probe, we investigate the scaling of the device properties with channel length. Using the tip as a voltage probe, we study the properties of the contacts. We find that Au makes an excellent contact in the p region, with no Schottky barrier. In the n region, large contact resistances were found which dominate the transport properties.
Yaish
Y
Y
Laboratory of Atomic and Solid-State Physics, Cornell University, Ithaca, NY 14853, USA.
Park
J-Y
JY
Rosenblatt
S
S
Sazonova
V
V
Brink
M
M
McEuen
P L
PL