title: Effects of phase change on reflection in phase-measuring interference microscopy.
abstract: We show by analytical and numerical calculations that the phase change on reflection that occurs in interference microscopy is almost independent of the numerical aperture of the objective. The shift of the microscope interferogram response due to the phase change on reflection, however, increases with the numerical aperture. Measurements of the interferogram shift are made with a Linnik interference microscope equipped with various numerical-aperture objectives and are reported and compared with theory.
authors.affiliation: Laboratoire d'Optique Physique, Ecole Supérieure de Physique et Chimie Industrielles, Centre National de la Recherche Scientifique, Unité Propre de Recherche A0005, 10 rue Vauquelin, F-75231 Paris Cedex 5, France. dubois@optique.espci.fr
authors.forename: Arnaud
authors.initials: A
authors.lastname: Dubois