title: XPS studies of thin polycyanurate films on silicon wafers.
abstract: Thin films of a diandicyanato bisphenol A (DCBA) prepolymer on silicon substrates have been investigated. Angle dependent X-ray photoelectron spectroscopy reveals some thickness-dependent features, which lead to an adsorption model for the DCBA prepolymer molecules. The adsorption of the first layer is governed by the interaction of the triazine rings with the substrate surface.
authors.affiliation: Fraunhofer-Institut für Angewandte Materialforschung Lesumer, Heerstrasse 36, D-28717, Bremen, Germany.
authors.forename: S
authors.initials: S
authors.lastname: Dieckhoff
authors.forename: V
authors.initials: V
authors.lastname: Schlett
authors.forename: W
authors.initials: W
authors.lastname: Possart
authors.forename: O D
authors.initials: OD
authors.lastname: Hennemann