Determination of slopes of calibration lines in multi element XRF analysis of thin films using polychromatic excitation from Mo, Au, W, and Cr anodes and one standard.
An algorithm is described for the theoretical calculation of the slopes of calibration lines for the elements of the K-series in multi element X-ray fluorescence analysis of thin films using polychromatic excitation with X-ray tubes producing widely differing primary radiation intensity profiles. The mathematical equations used to calculate slopes as a function of atomic number are based on the fundamental relationship between fluorescent intensity and atomic number, fluorescent yield, concentration and mass absorption coefficients of the analyte for primary radiation. A normalisation procedure based on a single known slope in the series ensured that the calculated slopes were correct for the particular measuring conditions.
Coetzee
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Department of Chemistry and Biochemistry, Rand Afrikaans University, PO Box 524, 2006, Auckland Park, Republic of South Africa.
Oosthuizen
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