title: Trace and surface analysis of ceramic layers of solid oxide fuel cells by mass spectrometry.
abstract: For the trace analysis of impurities in thick ceramic layers of a solid oxide fuel cell (SOFC) sensitive solid-state mass spectrometric methods, such as laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) and radiofrequency glow discharge mass spectrometry (rf-GDMS) have been developed and used. In order to quantify the analytical results of LA-ICP-MS, the relative sensitivity coefficients of elements in a La(0.6)Sr(0.35)MnO(3) matrix have been determined using synthetic standards. Secondary ion mass spectrometry (SIMS) - as a surface analytical method - has been used to characterize the element distribution and diffusion profiles of matrix elements on the interface of a perovskite/Y-stabilized ZrO(2) layer. The application of different mass spectrometric methods for process control in the preparation of ceramic layers for the SOFC is described.
authors.affiliation: Zentralabteilung für Chemische Analysen, Forschungszentrum Jülich GmbH, D-52425, Jülich, Germany.
authors.forename: J S
authors.initials: JS
authors.lastname: Becker
authors.forename: U
authors.initials: U
authors.lastname: Breuer
authors.forename: J
authors.initials: J
authors.lastname: Westheide
authors.forename: A I
authors.initials: AI
authors.lastname: Saprykin
authors.forename: H
authors.initials: H
authors.lastname: Holzbrecher
authors.forename: H
authors.initials: H
authors.lastname: Nickel
authors.forename: H J
authors.initials: HJ
authors.lastname: Dietze