title: Atomic force microscopy of coated glasses.
abstract: Atomic force microscopy has been used to investigate the topology of alkoxide gel dip coatings on different substrates. Results of SiO(2) - TiO(2) - ZrO(2) (STZ) coatings are presented on float glass, on polished fused silica, on commercially coated insulating flat glass, and on PtRh. Consolidated STZ coatings display the so-called glass pattern with ripples equal or less than 2 nm high. The same pattern is seen on partially dense STZ coatings, as soon as the surface is stiff enough for scanning, and also on the bottom of a 50 nm deep sputtering crater in the consolidated coating. The vitreous STZ coating on the fire side of the float glass is as flat as the float glass itself. It has the same tendency to contamination. 100 nm wide and 50 nm deep polishing grooves on fused silica have been filled up with the 80 nm thick coating, only dips of a few nm remain. The trenches between the SnO(2) crystallites on the insulating flat glass were filled up and the roughness of the substrate was partially reduced. PtRh sheet remained rough even after the coating. On the partially densified STZ coating, sputtering generates a grained surface.
authors.affiliation: Technische Universität Clausthal, Institut für Nichtmetallische Werkstoffe, Zehntnerstrasse 2a, D-38678, Clausthal-Zellerfeld, Germany.
authors.forename: E
authors.initials: E
authors.lastname: Rädlein
authors.forename: R
authors.initials: R
authors.lastname: Ambos
authors.forename: G H
authors.initials: GH
authors.lastname: Frischat