Background and line interference corrections in quantitative GD-OES - New approaches to an old problem.
The origin of radiative background in GD-OES is discussed, in connection with the problem of multi-matrix measurements in depth profile analysis. Backed by some experimental evidence in the form of line scans, it is argued that line emission from sample material and the plasma gas (Ar) make up the dominating contributions to the radiative background. The contribution from Ar, in this work termed Matrix-independent Background (MIB), is investigated in more detail. It is shown that, at constant voltage and current, the Ar emission intensity is nearly constant and independent of the pressure, but somewhat matrix-dependent. It is suggested that the MIB can be expressed as a linear function of the intensity of an Ar reference line. This idea is tested experimentally by making intensity measurements on a large set of calibration standards of varying composition. The results are fitted to a calibration function which allows optional definitions of the MIB. It is shown that with a MIB defined as a linear function of the Ar intensity, the different contributions to the spectral background can be more accurately determined than with the MIB defined as a constant.
Bengtson
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Swedish Institute for Metals Research, Drottning Kristinas Väg 48, S-114 28, Stockholm, Sweden.
Eklund
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Prässler
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