title: Investigation of the surface topography for the characterization of microstructures of amorphous SiN(x)-coatings.
abstract: SiN(x)-coatings have been deposited by reactive magnetron sputtering. Gas pressure and film thickness have been varied. Scanning electron microsopic views of the cross sections show a columnar structure as well as polycrystalline films varying with deposition parameters. For quantitative comparisons of the film morphology an average column diameter has been used as a characteristic value obtained from TEM images. Similar results have been obtained by scanning tunneling microscope avoiding a large expenditure of preparation. Scanning tunneling microscopy is suitable for investigations of the fractal nature of top surface of thin films and to determine the height function of thin SiN(x)-coatings on silicon wafers directly. Computer simulations of sputter processes allow to discuss the evolution of microstructures qualitatively.
authors.affiliation: Hochschule für Technik und Wirtschaft Zwickau, FB Physikalische Technik/Informatik, Dr.-Friedrichs-Ring 2A, D-08056, Zwickau, Germany.
authors.forename: W
authors.initials: W
authors.lastname: Zahn
authors.forename: W
authors.initials: W
authors.lastname: Wuttke
authors.forename: A
authors.initials: A
authors.lastname: Zösch