title: Characterization of the chemical bonding in inner layers of composite materials.
abstract: The efficiency of near edge structure investigations in electron energy loss spectroscopy (EELS) is discussed for characterizing the chemical bonding of elements present in the interfacial zone in fibre/matrix composites at nanometre resolution. Two different examples of corresponding analyses are given for a SiC-fibre reinforced borosilicate glass. In particular, the chemical bonding between silicon and carbon or oxygen (e.g. SiC, SiO(2) and SiO(x)C(y)), respectively, is characterized. The results have been attained in a fingerprint manner by comparing the fine structure measured from a material of unknown stoichiometry to that of a standard specimen. In addition, a possibility is demonstrated to image the chemical bonding by energy-filtered microscopy using energy loss near edge structures (ELNES).
authors.affiliation: Max-Planck-Institut für Mikrostrukturphysik Halle, Weinberg 2, D-06120, Halle, Germany.
authors.forename: R
authors.initials: R
authors.lastname: Schneider
authors.forename: J
authors.initials: J
authors.lastname: Woltersdorf
authors.forename: A
authors.initials: A
authors.lastname: Röder