An evaluation of radiation damage to solid state components flown in low earth orbit satellites.
The effects of total ionising radiation dose upon commercial off-the-shelf semiconductors fitted to satellites operating in low Earth orbit (LEO) conditions was evaluated. The evaluation was performed for the Korea Institute of Technology SATellite-1, (KITSAT-1) which was equipped with commercial solid state components. Two approximate calculation models for space radiation shielding were developed. Verification was performed by comparing the results with detailed three-dimensional calculations using the Monte-Carlo method and measured data from KITSAT-1. It was confirmed that the developed approximate models were reliable for satellite shielding calculations. It was also found that commercial semiconductor devices, which were not radiation hardened, could be damaged within their lifetime due to the total ionising dose they are subject to in the LEO environment. To conclude, an intensive shielding analysis should be considered when commercial devices are used.
Shin
Myung-Won
MW
Department of Nuclear Engineering, Kyung Hee University, Yongin-shi, Gyeongki-do, 449-701, Korea. mwshin@korea.com
Kim
Myung-Hyun
MH
D001417:Background Radiation; D003198:Computer Simulation; D004781:Environmental Exposure / Q000032:analysis*; D004868:Equipment Failure; D019544:Equipment Failure Analysis / Q000379:methods*; D008962:Models, Theoretical; D011522:Protons; D011874:Radiometry / Q000379:methods*; D012666:Semiconductors; D018531:Spacecraft
D011522:Protons