Electron microscope calibration for the Lorentz mode.
The calibration of a modern electron microscope for Lorentz microscopy observations has been performed using diffractogram, Fresnel diffraction fringe analysis and low-angle electron diffraction methods. An example related to the observations of electrostatic fields associated to a thinned reverse-biased p-n junction is also reported.
Fazzini
P F
PF
Department of Physics and Istituto Nazionale per la Fisica della Materia, University of Bologna, Viale B. Pichat 6/2, 40127 Bologna, Italy. fazzini@bo.imm.cnr.it
Merli
P G
PG
Pozzi
G
G