FDTD analysis of dielectric-loaded longitudinally slotted rectangular waveguides.
A versatile electromagnetic (EM) computational algorithm, based on the Finite-Difference Time-Domain (FDTD) technique, is developed to analyze longitudinally oriented, square-ended, single slot fixtures and slot-pair configurations cut in the broad wall of a WR-975 guide operating at a frequency of 915 MHz. The finite conductivity of the waveguide walls is accounted for by employing a time-domain Surface-Impedance Boundary Conditions (SIBC) formulation. The proposed FDTD algorithm has been validated against measurements performed on a probe-excited slot cut along the center line of the broad wall of a WR-284 guide and available experimental data for energy coupled from a longitudinal slot pair in the broad wall of a WR-340 guide. Numerical results are-presented to exploit the influence of the constitutive parameters of the processed material as well as protective insulating window slabs mounted on the exterior surface of the slots. Particular attention is given to the resonant length, scattering parameters, and the electric field distribution within lossy objects placed in the near-field region over a range of slot offsets and workloads with extensive results being reported for the first time. It is shown that the FDTD technique can accurately predict the coupling and power absorption characteristics in loads located in the near field zone of the slotted waveguide structures and, therefore, should prove to be a powerful design tool applicable to a wide class of slotted waveguide applicators that may be difficult to analyze using other available techniques.
Al-Rizzo
Hussain M
HM
Systems Engineering Dept., Donaghey College of Information Science and Systems Engineering, University of Arkansas, Little Rock, AR, USA.
Younies
Hassan Z
HZ
Clark
Ken G
KG
Tranquilla
Jim M
JM
D003198:Computer Simulation; D017076:Computer-Aided Design; D003296:Cooking / Q000295:instrumentation*; D017097:Electric Impedance; D004574:Electromagnetic Fields; D004867:Equipment Design / Q000379:methods*; D020342:Finite Element Analysis; D006361:Heating / Q000295:instrumentation*; D008872:Microwaves; D008962:Models, Theoretical; D011829:Radiation Dosage; D011874:Radiometry / Q000379:methods*