title: Interfacial melting of ice in contact with SiO(2).
abstract: The physical behavior of condensed matter can be drastically altered in the presence of interfaces. Using a high-energy x-ray transmission-reflection scheme, we have studied ice-SiO2 model interfaces. We observed the formation of a quasiliquid layer below the bulk melting temperature and determined its thickness and density as a function of temperature. The quasiliquid layer has stronger correlations than water and a large density close to rho(HDA)=1.17 g/cm(3) of high-density amorphous ice suggesting a structural relationship with the postulated high-density liquid phase of water.
authors.affiliation: Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, D-70569 Stuttgart, Germany.
authors.forename: S
authors.initials: S
authors.lastname: Engemann
authors.forename: H
authors.initials: H
authors.lastname: Reichert
authors.forename: H
authors.initials: H
authors.lastname: Dosch
authors.forename: J
authors.initials: J
authors.lastname: Bilgram
authors.forename: V
authors.initials: V
authors.lastname: Honkimäki
authors.forename: A
authors.initials: A
authors.lastname: Snigirev