title: Multiple-discriminant analysis for light-scattering spectroscopy and imaging of two-layered tissue phantoms.
abstract: We propose a new method for enhancing the sensitivity of the reflectance spectrum to the scattering feature of the superficial tissue layer. This method is based on multiple-discriminant analysis in the eigensubspace of the spectrum. Considering the application of scattering imaging, we evaluated this method by performing multispectral imaging of two-layered tissue phantoms. A color map converted from the spectral reflectance corresponds well to variations in the size of the scattering in the first layer.
authors.affiliation: Olympus Co., 2951 Ishikawa-cho, Hachioji-shi, Tokyo 192-8507, Japan. gono@isl.titech.ac.jp
authors.forename: Kazuhiro
authors.initials: K
authors.lastname: Gono
authors.forename: Makoto
authors.initials: M
authors.lastname: Igarashi
authors.forename: Takashi
authors.initials: T
authors.lastname: Obi
authors.forename: Masahiro
authors.initials: M
authors.lastname: Yamaguchi
authors.forename: Nagaaki
authors.initials: N
authors.lastname: Ohyama
mesh_terms: D016002:Discriminant Analysis; D004867:Equipment Design; D006801:Humans; D008027:Light; D008962:Models, Theoretical; D019047:Phantoms, Imaging; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity; D013057:Spectrum Analysis / Q000295:instrumentation