title: Application of the dual-beam FIB/SEM to metals research.
abstract: The dual-beam microscope is a combination of a focused ion beam with an electron beam. The instrument used in this work is also equipped with an energy-dispersive X-ray system for local elemental analysis. This powerful tool gives access to specific features inside a material. Two different applications are presented in this paper: (1) cross-sections and transmission electron microscope specimens cut in order to investigate the interface between an aluminium substrate and its epoxy coating; and (2) a grain boundary in a Cu(3)Au alloy. In both cases, the dual beam succeeded where other methods failed.
authors.affiliation: Netherlands Institute for Metals Research, Rotterdamseweg 137, 2628 AL Delft, The Netherlands. V.G.M.sivel@tnw.tudelft.nl
authors.forename: V G M
authors.initials: VG
authors.lastname: Sivel
authors.forename: J
authors.initials: J
authors.lastname: Van den Brand
authors.forename: W R
authors.initials: WR
authors.lastname: Wang
authors.forename: H
authors.initials: H
authors.lastname: Mohdadi
authors.forename: F D
authors.initials: FD
authors.lastname: Tichelaar
authors.forename: P F A
authors.initials: PF
authors.lastname: Alkemade
authors.forename: H W
authors.initials: HW
authors.lastname: Zandbergen