Scattering-type near-field optical microscopy.
A highly promising tool for nanoscale material characterization exploits local optical/infrared light scattering simultaneously with standard atomic force microscopy imaging. Thus, both the topography and the local optical/infrared properties of a sample surface can be mapped at better than 20 nm spatial resolution.
Keilmann
Fritz
F
Max-Planck-Institut für Biochemie, D-82152 Martinsried (München), Germany. keilmann@biochem.mpg.de