High-order correlations from rough-surface scattering.
It is proposed to apply an optical setup of a randomly weak rough dielectric film on a reflecting metal substrate for the measurement of high-order correlations from rough-surface scattering. The angular amplitude and intensity correlations are measured. Because of multiple scattering, when the input laser beam size is comparatively small or close to the travel pass length inside the film, C(2) and C(3) are measured by subtraction of the amplitude correlation from the intensity correlation.
Gu
Zu-Han
ZH
Surface Optics Corporation, 11555 Rancho Bernardo Road, San Diego, California 92127-1441, USA. zgu@surfaceoptics.com